Ion backscattering has been used to study the formation of
Cu2S
layers on single crystal
normalCdS
due to the chemical ion exchange reaction2Cu++normalCdS→Cu2S+Cd++The reaction is found to proceed most rapidly on the A (Cd) face, slower on the B (S) face, with the reaction proceeding slowest on faces perpendicular to the <112̅0> axis. Reactions on the A and B faces are characterized by a very nonuniform
Cu2S‐normalCdS
interface, whereas the interface for reactions along the <112̅0> is much more uniform. The reaction in the latter case may be controlled by surface nucleation, and layer formation subsequent to formation of a 300–500Å thick layer is much slower. The formation of
Cu2S
on the A and B faces has an activation energy of 0.9–1.5 eV. Preparation of the surface by polishing leads to a larger rate of
Cu2S
formation and
Cu2S‐normalCdS
interfaces which are more uniform as a function of depth than those in etched samples.