2018
DOI: 10.1021/acsami.8b00026
|View full text |Cite
|
Sign up to set email alerts
|

Stoichiometric and Oxygen-Deficient VO2 as Versatile Hole Injection Electrode for Organic Semiconductors

Abstract: Using photoemission spectroscopy, we show that the surface electronic structure of VO is determined by the temperature-dependent metal-insulator phase transition and the density of oxygen vacancies, which depends on the temperature and ultrahigh vacuum (UHV) conditions. The atomically clean and stoichiometric VO surface is insulating at room temperature and features an ultrahigh work function of up to 6.7 eV. Heating in UHV just above the phase transition temperature induces the expected metallic phase, which … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
11
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
5

Relationship

3
2

Authors

Journals

citations
Cited by 13 publications
(11 citation statements)
references
References 66 publications
(101 reference statements)
0
11
0
Order By: Relevance
“…Notably, a finite DOS at the Fermi level ( E F ) is visible in the spectra after the ASA process (Figure c) although the measurements were performed at room temperature and thus in the insulating state of VO 2 . However, the DOS at E F and the pronounced increase of the V 3d‐derived band intensity is not due to the phase transition of VO 2 , but due to the presence of oxygen vacancies as evidenced by the high abundance of lower oxidation state V (Figure ). In contrast, for stoichiometric VO 2 after ASAO process the intensity at E F is not visible and V 3d band appears as well‐defined peak, similar to previous VO 2 single crystal[23b,25] and thin film results.…”
Section: Resultsmentioning
confidence: 97%
See 4 more Smart Citations
“…Notably, a finite DOS at the Fermi level ( E F ) is visible in the spectra after the ASA process (Figure c) although the measurements were performed at room temperature and thus in the insulating state of VO 2 . However, the DOS at E F and the pronounced increase of the V 3d‐derived band intensity is not due to the phase transition of VO 2 , but due to the presence of oxygen vacancies as evidenced by the high abundance of lower oxidation state V (Figure ). In contrast, for stoichiometric VO 2 after ASAO process the intensity at E F is not visible and V 3d band appears as well‐defined peak, similar to previous VO 2 single crystal[23b,25] and thin film results.…”
Section: Resultsmentioning
confidence: 97%
“…The transition temperature was 335 K. More details about the VO 2 thin film fabrication can be found in refs. and .…”
Section: Methodsmentioning
confidence: 97%
See 3 more Smart Citations