STM study of the surface morphology of gold on mica

Chidsey, Christopher E. D.; Loiacono, D. N.; Sleator, Tycho; Nakahara, S.

doi:10.1016/0039-6028(88)90432-3

Cited by 238 publications

(147 citation statements)

References 17 publications

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“…Substrates were prepared by resistive evaporation of gold (99.999%) onto the surface of freshly cleaved mica which was preheated in vacuum to ,-.,340* C. 6 The base pressure in the chamber during evaporation was S 6 x 10-7 torr. After -100 nm of gold was deposited, the substrate temperature was returned to <4 0°C while still under vacuum, then the chamber was back-filled with purified nitrogen, the substrates removed, and immersed immediately in the thiol solutions.…”

Section: Methodsmentioning

confidence: 99%

Scanning tunneling microscopy studies of self-assembled monolayers of alkanethiols on gold

Stranick

Kamna

Krom

et al. 1994

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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DTIC QT,, ALT. ns . ME MIlollfJ94 6 1 087form Approved REPORT DOCUMENTATION PAGE o1m 8 4:=,m--;~I 0 .1fft -C-tP-PU-W1KA.t AV0014t~a.9 -% stmated to 41wwqe 1 %,wig ow rosoon, maIudm9 thme 1~fo refvwtnq mIWWudmOAI. Warxew" ewtranIM data Wofte%P3a~' ape ftaptauewg we ta ne~gd. and (cfleti9 ago fft4*.flq trn. a-mttwn of SInoIUI*tSon so"4 crnaeunts e, ABSTRACT (Maximm 20words)We have used scanning tunneling microscopy to probe the molecular scale structures of pure and mixed composition self-assembled monolayers of CH 3 (CH 2 ) 15 SH and CH 3 0 2 C(CH 2 ) 15 SH on gold. A predominant defect structure is found for both films and is assigned as a void defect in the thiolate overlayer. The mixed composition films are observed to phase segregate into domains of the pure component thiolates. Tune-lapse series of scanning tunneling microscope images reveal kink-driven motion at step edges and exchange of thiolate molecules on terraces.14.

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Section: Methodsmentioning

confidence: 99%

Scanning tunneling microscopy studies of self-assembled monolayers of alkanethiols on gold

Stranick

Kamna

Krom

et al. 1994

Journal of Vacuum Science &Amp; Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

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“…The representative SPM are scanning tunneling microscopy (STM) and atomic force microscopy (AFM). However, the STM can only be used for measuring the surface of conductor [3]. When the AFM works at the contact mode and the tapping mode, the large contact stress will damage the sample surface because of the sharp tip of the scanning probe [4].…”

Section: Introductionmentioning

confidence: 99%

Experiment of Polarization Forces in Scanning Electrostatic Force Microscopy for Measuring Surface Profile of Dielectric

Jia²,

Ito³

et al. 2014

TOEEJ

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For measuring the surface profile of many micro-optical components with complicated shapes, which are made of non-conductive material, the electrostatic force microscopy (EFM) was recommended. The relationship between the polarization force and the tip-to-sample distance was analyzed based on dielectric polarization theory. The prototype of the scanning electrostatic force microscopy was built. The force curves of different samples with different materials and surface shapes were detected by the EFM prototype. Both theoretical analysis and the experimental results demonstrated that the EFM system can be used to measure the surface profile of non-conductor.

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“…Therefore, the ellipsoidal image shown in Fig. 1 is due to the actual topographi c structure of the deposited film, which depends on deposition conditions (Chidsey et al, 1988). We found that the Pt film was stable and its image was not affected by exposing the sample to air for a period of two days.…”

Section: Methodsmentioning

confidence: 72%

“…It has been proven that STM can be useful in studying epitaxic growth of an Au(lll) thin film on mica (Chidsey, Loiacono, Sleator & Nakahara, 1988). Surface features such as monoatomic steps, dislocations and grain boundaries were studied against various deposition conditions.…”

Section: Introductionmentioning

confidence: 99%

Scanning tunneling microscopy of the annealing of a thin platinum film on highly oriented pyrolytic graphite

Zhou¹,

Gülari²

1991

Acta Cryst Sect A

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Scanning tunneling microscopy (STM) was used to study morphological changes of a Pt thin film deposited on highly oriented pyrolytic graphite (HOPG) during an annealing process. In air, it was possible to image the morphology of the thin film with a vertical resolution of 0.5 A, and a lateral resolution of 20 A. Surface structural change was observed after the annealing processes. When the annealing temperature was below 573 K, surface morphology changed only slightly. Between 573 and 873 K, the originally uniformly distributed rolling hills of Pt coagulated into larger clumps. Above 873 K, Pt crystal facets started to form on the surface. At 1123 K, a large portion of the surface turned into well defined Pt crystal facets. Above 1123 K, the Pt film started to crack and formed scattered crystals on the HOPG surface. A complementary X-ray diffraction measurement showed that the crystallized Pt film was preferentially oriented with the (111) plane parallel to the substrate graphite (0001) basal plane, indicating epitaxy of the Pt overlayer with the graphite substrate underneath.

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STM study of the surface morphology of gold on mica

Cited by 238 publications

References 17 publications

Scanning tunneling microscopy studies of self-assembled monolayers of alkanethiols on gold

Scanning tunneling microscopy studies of self-assembled monolayers of alkanethiols on gold

Experiment of Polarization Forces in Scanning Electrostatic Force Microscopy for Measuring Surface Profile of Dielectric

Scanning tunneling microscopy of the annealing of a thin platinum film on highly oriented pyrolytic graphite

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