2002
DOI: 10.1063/1.1425391
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Status of the Center for Advanced Microstructures and Devices (CAMD)-2001

Abstract: The current status of the Louisiana State University Center for Advanced Microstructures and Devices electron storage ring, beamlines, and the scientific program are described.

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Cited by 10 publications
(8 citation statements)
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“…The Li 2 B 4 O 7 :RE extended X-ray absorption fine structure (EXAFS) spectra were measured using a double crystal monochromator of Lemonnier type [56] at the DCM and WDCM beamlines located at the Center for Advanced Microstructures and Devices (CAMD) [57][58][59]. Due to the thickness of the glass samples and low dopant concentrations (nominally 1%), the absorption spectra were measured in fluorescence mode and the spectra analyzed without self-absorption corrections.…”
Section: Methodsmentioning
confidence: 99%
“…The Li 2 B 4 O 7 :RE extended X-ray absorption fine structure (EXAFS) spectra were measured using a double crystal monochromator of Lemonnier type [56] at the DCM and WDCM beamlines located at the Center for Advanced Microstructures and Devices (CAMD) [57][58][59]. Due to the thickness of the glass samples and low dopant concentrations (nominally 1%), the absorption spectra were measured in fluorescence mode and the spectra analyzed without self-absorption corrections.…”
Section: Methodsmentioning
confidence: 99%
“…The IPES was limited by an instrumental line width of approximately 400 meV, as described elsewhere [20, 21]. Key to this work, however, are the angle resolved photoemission spectroscopy (ARPES) measurements that employed plane polarized synchrotron radiation dispersed by a 3m toroidal grating monochromator [26, 27], at the Center for Advanced Microstructures and Devices (CAMD) [2830]. The measurements were made in a UHV chamber employing a hemispherical electron analyzer with an angular acceptance of ±1°, as described elsewhere [26, 27].…”
Section: Methodsmentioning
confidence: 99%
“…The photoemission experiments were conducted on the 3 m TGM beamline [37] at the Center for Advanced Microstructures and Devices at Louisiana State University [38][39][40]. The beamline is equipped with a photoemission endstation with a 50 mm hemispherical electron energy analyzer, with a resolution of about 70 meV, as described elsewhere [37,41].…”
Section: Methodsmentioning
confidence: 99%