Statistische Methode für die Zuverlässigkeitsanalyse

Härtler, Gisela

doi:10.1007/978-3-7091-9499-7

Cited by 41 publications

(5 citation statements)

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“…the usual approach. A first run of experiments consisted of 25 trials, 15 of which were planned as a factorial experiment with a cubic design and edge lengths of 0.7 A s IFAV C 2.1 A; 400 V S URM S 1200 V; and 60°C 6 6, S 127°C.…”

Section: Experimental Results and A First Interpretation With The Weimentioning

confidence: 99%

Accelerated life‐test experiments on low‐power rectifier diodes

Windel¹

1990

Quality & Reliability Eng

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Low‐power rectifier diodes were stressed by different forward currents IF, reverse voltages UR, and ambient temperatures a for a time interval (0, t*) in order to analyse the resulting distributions. Owing to the limitations in the test time, t*, the gathering of comprehensive information about their performance requires high stress levels without exceeding either physical limits or the limits for initiating thermal runaway. First, the results of lifetime experiments related to the middle stress region were described by a Weibull distribution with constant shape parameter and stress‐dependent scale parameter. This model, however, did not fit sufficiently the typical features of the real‐life distribution. Therefore a non‐parametric measure called the average initial reliability in (O,t*) was defined using the experimental results. Its stress dependence was estimated. The results are guiding figures of stress conditions both for accelerated tests and for circuits with high demands on reliability.

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Section: Experimental Results and A First Interpretation With The Weimentioning

confidence: 99%

Accelerated life‐test experiments on low‐power rectifier diodes

Windel¹

1990

Quality & Reliability Eng

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“…In a further step the significance of these influences has to be verified by an analysis of variance [7]. The detailed procedure can be gleaned in [6] or any further statistical publication, which deals Advanced Materials Research Vols.…”

Section: Methodsmentioning

confidence: 99%

Statistical Investigations on Friction Stir Welded Aluminum Tailored Blanks for a Robust Process Window

Giera

Merklein

Geiger

2005

AMR

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The multifarious applications of aluminum alloys in different industrial domains are based on the mechanical properties as well as the light weight characteristics, which allow energy saving for the products in use. Nevertheless aluminum alloys are considered to be difficult to weld by conventional welding processes. This paper deals with cost-effective friction stir welding of thin sheet aluminum alloys in thicknesses of about 1 mm to widen the possible range of applications. Based on former studies results will be shown how an optimized tool geometry increases the mechanical properties of friction stir welded parts. The characteristics of these friction stir welded thin sheets will be analysed in a statistical evaluation in order to detect the interactions and dependencies of the process parameters. By highlighting the main process parameters and their significances a process window for friction stir welded blanks of AA5182 and AA6016 is presented.

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“…There seems to be no agreement in the literature on how to calculate the confidence intervals for this type of censoring [7]. The selected approach argues that the confidence intervals can be calculated with the help of the β-distribution as follows [8]: (see (4)) where B x (a, b) is the xth percentile of the β-distribution with the two shape parameters a and b. According to [8], this approach is also valid in case of no failures (k = 0), in which case no meaningful failure rate or lower limit can be derived and instead only the one sided upper limit [(1 − α) th percentile] is to be used.…”

Section: Iet Power Electronicsmentioning

confidence: 99%

“…The selected approach argues that the confidence intervals can be calculated with the help of the β ‐distribution as follows [8]:

λ_{0} \in (][, - \frac{1}{T} \ln (1 - B_{α / 2} (k + 1, n - k + 1)), - \frac{1}{T} \ln ()(, 1 - B_{1 - α / 2} ()(, k + 1, n - k + 1)))

where B x ( a , b ) is the x th percentile of the β ‐distribution with the two shape parameters a and b . According to [8], this approach is also valid in case of no failures ( k = 0), in which case no meaningful failure rate or lower limit can be derived and instead only the one sided upper limit [(1 − α ) th percentile] is to be used. As the method might be disputable [7], the important upper limits of the failure rates of the experimental test runs without failures calculated with (4) were also compared with the confidence limits computed with a Bayesian analysis (by the statistics software Minitab 17): The values obtained from these two methods agree within 5%.…”

Section: Statistics Of Random Failuresmentioning

confidence: 99%

Impact of device technology on cosmic ray failures in power modules

Scheuermann

Schilling

2016

IET Power Electronics

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More than 20 years ago, the phenomenon of cosmic ray induced failures in power electronic devices was first reported. High energy particles can generate 'single event burnout' failures in power devices in blocking state, i.e. the device loses its blocking capability without any precursor on a nanosecond time scale. Whilst the root cause of the failure can rarely be identified after an explosion of the inverter, the statistical probability of cosmic ray failures can be determined from experiment, so that this random failure rate can be well predicted for power electronic systems. The considerable impact of device architecture will be demonstrated by experimental results for freewheeling diodes, showing that the CAL diode is very robust with regard to cosmic ray failures.

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Statistische Methode für die Zuverlässigkeitsanalyse

Cited by 41 publications

References 0 publications

Accelerated life‐test experiments on low‐power rectifier diodes

Accelerated life‐test experiments on low‐power rectifier diodes

Statistical Investigations on Friction Stir Welded Aluminum Tailored Blanks for a Robust Process Window

Impact of device technology on cosmic ray failures in power modules

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