Statistical Property of Breakdown Between Metal Electrodes in Vacuum

Toya, H.; Ueno, Naohiro; Okada, Toshio; Murai, Y.

doi:10.1109/tpas.1981.316537

Cited by 36 publications

(8 citation statements)

References 4 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Here, the focus is on breakdowns under DC fields in noble liquid dielectrics. A universally agreed-upon factor affecting DC breakdown behavior is the stressed area effect [7][8][9][10][11][12][13][14][15][16][17]. Some studies also report a decreasing dielectric strength with an increase of the stressed liquid volume [12,13,15,16].…”

Section: Introductionmentioning

confidence: 99%

Direct comparison of high voltage breakdown measurements in liquid argon and liquid xenon

et al. 2019

View full text Add to dashboard Cite

A: As noble liquid time projection chambers grow in size their high voltage requirements increase, and detailed, reproducible studies of dielectric breakdown and the onset of electroluminescence are needed to inform their design. The Xenon Breakdown Apparatus (XeBrA) is a 5-liter cryogenic chamber built to characterize the DC high voltage breakdown behavior of liquid xenon and liquid argon. Electrodes with areas up to 33 cm 2 were tested while varying the cathode-anode separation from 1 to 6 mm with a voltage difference up to 75 kV. A power-law relationship between breakdown field and electrode area was observed. The breakdown behavior of liquid argon and liquid xenon within the same experimental apparatus was comparable.

show abstract

Section: Introductionmentioning

confidence: 99%

Direct comparison of high voltage breakdown measurements in liquid argon and liquid xenon

et al. 2019

View full text Add to dashboard Cite

show abstract

“…Experiments have mainly been conducted by applying either voltage pulses or DC voltage levels over pairs of parallel plate electrodes. Threshold voltage of breakdown has been the main quantity of interest, and it has been found to follow a Weibull distribution [14,15]. Studies have been done of how the threshold voltage depends on vacuum gap distance [14,16,17], electrode area [14,18,19], external circuit characteristics [17,20,21], surface coating [17], and the presence of embedded microparticles in the cathode [22].…”

Section: Introductionmentioning

confidence: 99%

Statistics of vacuum breakdown in the high-gradient and low-rate regime

Wuensch

Degiovanni

Calatroni

et al. 2017

Phys. Rev. Accel. Beams

View full text Add to dashboard Cite

In an increasing number of high-gradient linear accelerator applications, accelerating structures must operate with both high surface electric fields and low breakdown rates. Understanding the statistical properties of breakdown occurrence in such a regime is of practical importance for optimizing accelerator conditioning and operation algorithms, as well as of interest for efforts to understand the physical processes which underlie the breakdown phenomenon. Experimental data of breakdown has been collected in two distinct high-gradient experimental setups: A prototype linear accelerating structure operated in the Compact Linear Collider Xbox 12 GHz test stands, and a parallel plate electrode system operated with pulsed DC in the kV range. Collected data is presented, analyzed and compared. The two systems show similar, distinctive, two-part distributions of number of pulses between breakdowns, with each part corresponding to a specific, constant event rate. The correlation between distance and number of pulses between breakdown indicates that the two parts of the distribution, and their corresponding event rates, represent independent primary and induced follow-up breakdowns. The similarity of results from pulsed DC to 12 GHz rf indicates a similar vacuum arc triggering mechanism over the range of conditions covered by the experiments.

show abstract

“…Therefore, the results of this paper show that the βE bd values had the area effect of vacuum breakdown fields by the area of field electron emission. The similarity is that the breakdown fields in a vacuum deteriorated as the electrode area increased, which is called the Area effect of breakdown field in a vacuum . Here, ‘ A ’ is considered to correspond to the number of weak points on the multiple aperture electrode.…”

Section: Resultsmentioning

confidence: 99%

Relationship between the electric field integral value and vacuum breakdown characteristics in small electrode with multi‐apertures

Okura

Nishiyama

Yamano

et al. 2019

IEEJ Transactions Elec Engng

View full text Add to dashboard Cite

For a critical plasma test equipment JT-60SA, vacuum electric breakdown around apertures is a serious problem for developing a high-energy and high-power negative ion source accelerator. To improve the high voltage performance of the accelerator, we investigated the relation of a breakdown electric field in a vacuum with the electric field integral value of electrode's surface for multi-apertures electrode. The results of breakdown tests for various types of multi-aperture electrode show that the electric field integration ES had a relation with the vacuum breakdown field and field emission current characteristics. The reduction in the ES with the relaxation of electric fields improved the breakdown performance. Moreover, the low value of ES decreased the field enhancement factor 'β' and the emission area 'A' of field electron emission from the electrode. Therefore, we found that the breakdown electric field can be improved by reducing the prebreakdown current that flows before the occurrence of breakdown by reducing the ES .

show abstract

Statistical Property of Breakdown Between Metal Electrodes in Vacuum

Cited by 36 publications

References 4 publications

Direct comparison of high voltage breakdown measurements in liquid argon and liquid xenon

Direct comparison of high voltage breakdown measurements in liquid argon and liquid xenon

Statistics of vacuum breakdown in the high-gradient and low-rate regime

Relationship between the electric field integral value and vacuum breakdown characteristics in small electrode with multi‐apertures

Contact Info

Product

Resources

About