Statistical Lock-in Thermography to Improve Contrast and Detectivity of ICs Thermal Maps

Cozzi, Maxime; Galliere, Jean-Marc; Maurine, Philippe

doi:10.1109/therminic.2019.8923769

2019 25th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC) 2019

DOI: 10.1109/therminic.2019.8923769

|View full text |Cite

Statistical Lock-in Thermography to Improve Contrast and Detectivity of ICs Thermal Maps

Maxime Cozzi

Jean-Marc Galliere

Philippe Maurine

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2022

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Statistical Lock-in Thermography to Improve Contrast and Detectivity of ICs Thermal Maps

Cited by 1 publication

References 7 publications

A comprehensive survey of physical and logic testing techniques for Hardware Trojan detection and prevention

A comprehensive survey of physical and logic testing techniques for Hardware Trojan detection and prevention

Contact Info

Product

Resources

About