Abstract:In this paper we present a technique to statistically estimate transition delay and path delay fault coverage. The basic method is an extension of STAFAN to include delay faults. By partitioning a combinational circuit into non-overlapping fanout free logic cones, we accurately calculate the transition sensitization controllabilities of 0 ~ 1 and 1 -~ 0 transitions of the lines within a fanout free logic cone to the output of the fanout free logic cone for each fanout free logic cone. A strategy to calculate t… Show more
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