Statistical Circuit Design: Linear Circuits and Statistical Design

Semmelman, C. L.; Walsh, E. D.; Daryanani, G.

doi:10.1002/j.1538-7305.1971.tb02548.x

Cited by 14 publications

(2 citation statements)

References 5 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…An active low-pass ÿlter [13] shown in Figure 4 Assume that the faulty parameters are R6 which was changed from 10.0 to 20:0k and R26 changed from 111.1 to 75:0 k . The corresponding admittance deviations are G6 = 1=20 000− 1=10 000 = − 5:0e − 5= and G26 = 1=75 000 − 1=111 100 = 4:3324e − 6= .…”

Section: Examplementioning

confidence: 99%

A generalized fault diagnosis method in dynamic analogue circuits

Liu

Starzyk

2002

Circuit Theory & Apps

View full text Add to dashboard Cite

SUMMARYFault diagnosis of analogue circuits is essential for analogue and mixed-signal systems testing and maintenance. A new method is proposed in this paper for multiple fault diagnosis of linear analogue circuits in frequency domain. The Woodbury formula is applied to the modiÿed nodal equation to construct the fault diagnosis equation, which relates the limited measured circuit responses with the multiple faults inside the circuit in a linear way. A recently developed ambiguity group locating technique is modiÿed here to identify the faulty parameters directly. Computation cost is reduced compared to combinatorial search in traditional fault veriÿcation methods. Only one node is needed for voltage measurement, but multiple excitations on accessible nodes are required for fault identiÿcation. Parameter evaluation can provide the exact solution to the deviated values of faulty parameters. The faulty parameter deviations can have any ÿnite values. Example circuits are provided to illustrate the proposed method. Two other methods for multiple analogue fault diagnosis sharing the same mechanism as the method proposed in this paper are also brie y described. The proposed method is extremely e ective for the circuit with very limited accessible nodes and is also computationally e cient.

show abstract

Section: Examplementioning

confidence: 99%

A generalized fault diagnosis method in dynamic analogue circuits

Liu

Starzyk

2002

Circuit Theory & Apps

View full text Add to dashboard Cite

show abstract

“…These four realizations of the Butterworth filter as well as the passive ladder realization were compared by a :Vlonte-Carlo study (with 200 trials) using the computer program BELTAP. 9 The following assumptions are made:…”

Section: Ati(s)mentioning

confidence: 99%

Design and Evaluation of Shifted-Companion-Form Active Filters

Tow¹

1975

Bell System Technical Journal

View full text Add to dashboard Cite

show abstract

L5 System: Role of Computing and Precision Measurements

Chen¹,

Hempstead²,

Kuo³

et al. 1974

Bell System Technical Journal

View full text Add to dashboard Cite

The L5 Coaxial‐Carrier Transmission System is the first long‐haul, high‐capacity transmission system for which the design was strongly influenced by extensive application of computer‐aided design (cad) techniques. A tight time schedule required a parallel effort of (i) improving and using the somewhat limited capabilities of existing cad programs and (ii) developing new programs having increased capability and efficiency. Similar development of computer‐controlled measurement techniques provided necessary device and component characterization and subsystem evaluation. The result is a powerful group of tools that are independently important, but whose combined use helped make possible the timely completion of the L5 system design. These tools, now “proved in,” will profoundly influence the next system design philosophy.

show abstract

Statistical Circuit Design: Linear Circuits and Statistical Design

Cited by 14 publications

References 5 publications

A generalized fault diagnosis method in dynamic analogue circuits

A generalized fault diagnosis method in dynamic analogue circuits

Design and Evaluation of Shifted-Companion-Form Active Filters

L5 System: Role of Computing and Precision Measurements

Contact Info

Product

Resources

About