Statistical analysis of tin whisker growth

Fang, Tong; Osterman, Michael; Pecht, Michael

doi:10.1016/j.microrel.2005.06.002

Cited by 52 publications

(24 citation statements)

References 5 publications

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“…The summary data are presented in Table II. In addition, we have verified that the whisker length statistics obeys the earlier established log-normal patterns 18,21,22 as shown in Fig. 8.…”

Section: Resultssupporting

confidence: 82%

Electric field stimulated growth of Zn whiskers

et al. 2016

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We have investigated the impact of strong (∼10 4 V/cm) electric fields on the development of Zn whiskers. The original samples, with considerable whisker infestation were cut from Zn-coated steel floors and then exposed to electric fields stresses for 10-20 hours at room temperature. We used various electric field sources, from charges accumulated in samples irradiated by: (1) the electron beam of a scanning electron microscope (SEM), (2) the electron beam of a medical linear accelerator, and (3) the ion beam of a linear accelerator; we also used (4) the electric field produced by a Van der Graaf generator. In all cases, the exposed samples exhibited a considerable (tens of percent) increase in whiskers concentration compared to the control sample. The acceleration factor defined as the ratio of the measured whisker growth rate over that in zero field, was estimated to approach several hundred. The statistics of lengths of e-beam induced whiskers was found to follow the log-normal distribution known previously for metal whiskers. The observed accelerated whisker growth is attributed to electrostatic effects. These results offer promise for establishing whisker-related accelerated life testing protocols. C 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license

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“…The summary data are presented in Table II. In addition, we have verified that the whisker length statistics obeys the earlier established log-normal patterns 18,21,22 as shown in Fig. 8.…”

Section: Resultssupporting

confidence: 82%

Electric field stimulated growth of Zn whiskers

et al. 2016

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“…The observed distributions of this kind were best approximated as log-normal. 10,58,59 Their analytical form is derived here.…”

Section: Whisker Statisticsmentioning

confidence: 99%

Electrostatic Theory of Metal Whiskers

Карпов

2014

Phys. Rev. Applied

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Metal whiskers often grow across leads of electric equipment and electronic package causing current leakage or short circuits and raising significant reliability issues. The nature of metal whiskers remains a mystery after several decades of research. Here, the existence of metal whiskers is attributed to the energy gain due to electrostatic polarization of metal filaments in the electric field. The field is induced by surface imperfections: contaminations, oxide states, grain boundaries, etc. A proposed theory provides closed form expressions and quantitative estimates for the whisker nucleation and growth rates, explains the range of whisker parameters and effects of external biasing, and predicts statistical distribution of their lengths.

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“…Whiskers can grow to reach a few millimeters in length and are hollow with a striated surface [2]. Three main parameters, density, length, and growth rate, influence the risks created by tin whiskers [4]. The length of a whisker is measured from the plating surface [5] and can be measured in two ways according to the Joint Electron Device Engineering Council (JEDEC) standard.…”

Section: Introductionmentioning

confidence: 99%

“…The second method is to take the length from the base of the whisker to the most distant point (not including any bend at the tip) and draw a circle. The radius of that circle is taken as the length of the whisker [4]. Growth rate portrays the end-to-end span of a whisker changing over a certain time.…”

Section: Introductionmentioning

confidence: 99%

Effect of Environmental Conditions on Tin (Sn) Whisker Growth

Aglan¹,

Prayakarao²,

Rahman³

et al. 2015

ENG

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This research focuses on tin whisker growth under two different environmental conditions namely hygrothermal and a salt solution. Tin coated brass coupons were used for this study to analyze the growth of tin whiskers over time. Their growth rates were examined periodically using optical and scanning electron microscopy. The physical characteristics of the tin whiskers were identified for each environmental condition. It was discovered that submersion of tin coated brass substrates in 5% salt solution considerably increased the density (number of whiskers per unit area), and the length of the whiskers. In addition, it was found that the geometry and aspect ratio of tin whiskers were different for each environment.

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Statistical analysis of tin whisker growth

Cited by 52 publications

References 5 publications

Electric field stimulated growth of Zn whiskers

Electric field stimulated growth of Zn whiskers

Electrostatic Theory of Metal Whiskers

Effect of Environmental Conditions on Tin (Sn) Whisker Growth

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