Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications

Adriaens, Annemie; Vaeck, Luc Van; Adams, F.

doi:10.1002/(sici)1098-2787(1999)18:1<48::aid-mas2>3.0.co;2-i

Cited by 76 publications

(46 citation statements)

References 169 publications

(125 reference statements)

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“…Mass spectral libraries have become available recently [4,5] but contain only a selected range of inorganic compounds. The work on inorganic compounds with S-SIMS in dierent ®elds has been reviewed recently [6,7].…”

Section: Introductionmentioning

confidence: 99%

Molecular information in static SIMS for the speciation of inorganic compounds

Ham

Adriaens

Vaeck

et al. 2000

Nuclear Instruments and Methods in Physics Research Section B:

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This paper presents a systematic study of pure inorganic binary salts using a time-of-¯ight (TOF) static secondary ion mass spectroscopy (S-SIMS) instrument. The objective was to evaluate the methodÕs capability to achieve molecular speciation of binary salts. The results show the feasibility of direct speciation in a deductive manner without the need for reference spectra. Also ratioing intensities of speci®c high-m/z cluster ions can dierentiate compounds with the same elements in dierent oxidation states. Ó

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Section: Introductionmentioning

confidence: 99%

Molecular information in static SIMS for the speciation of inorganic compounds

Ham

Adriaens

Vaeck

et al. 2000

Nuclear Instruments and Methods in Physics Research Section B:

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“…It has three major effects: (1) mixing of the upper layers of the sample, resulting in an amorphization of the surface; (2) implantation of atoms from the primary ion beam into the sample, and (3) ejection of secondary particles (atoms and small molecules), i.e., sputtering. The latter effect is exploited in the powerful surface characterization technique SIMS [7][8][9].…”

Section: Surface Characterizationmentioning

confidence: 99%

“…Examples include particle detection, diagnostic surface characterization techniques such as secondary ion mass spectrometry (SIMS) [6][7][8][9], X-ray photon spectroscopy (XPS) [10], Auger electron spectroscopy (AES) [11,12] and surface fabrication (lithography and chemical vapor deposition) [13][14][15][16]. When not directly exploited, particlesurface interactions often cause artifacts to be acknowledged, understood, and, if possible, eliminated.…”

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confidence: 99%

IonCCD Detector for Miniature Sector-Field Mass Spectrometer: Investigation of Peak Shape and Detector Surface Artifacts Induced by keV Ion Detection

Hadjar

Schlathölter

Davila

et al. 2011

J. Am. Soc. Mass Spectrom.

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A recently described ion charge coupled device detector IonCCD (Sinha and Wadsworth, Rev. Sci. Instrum. 76(2), 2005; Hadjar, J. Am. Soc. Mass Spectrom. 22(4), [612][613][614][615][616][617][618][619][620][621][622][623][624] 2011) is implemented in a miniature mass spectrometer of sector-field instrument type and MattauchHerzog (MH)-geometry (Rev. Sci. Instrum. 62(11), 2618-2620, 1991; Burgoyne, Hieftje and Hites J. Am. Soc. Mass Spectrom. 8(4), 307-318, 1997; Nishiguchi, Eur. J. Mass Spectrom. 14 (1), 7-15, 2008) for simultaneous ion detection. In this article, we present first experimental evidence for the signature of energy loss the detected ion experiences in the detector material. The two energy loss processes involved at keV ion kinetic energies are electronic and nuclear stopping. Nuclear stopping is related to surface modification and thus damage of the IonCCD detector material. By application of the surface characterization techniques atomic force microscopy (AFM) and X-ray photoelectrons spectroscopy (XPS), we could show that the detector performance remains unaffected by ion impact for the parameter range observed in this study. Secondary electron emission from the (detector) surface is a feature typically related to electronic stopping. We show experimentally that the properties of the MH-mass spectrometer used in the experiments, in combination with the IonCCD, are ideally suited for observation of these stopping related secondary electrons, which manifest in reproducible artifacts in the mass spectra. The magnitude of the artifacts is found to increase linearly as a function of detected ion velocity. The experimental findings are in agreement with detailed modeling of the ion trajectories in the mass spectrometer. By comparison of experiment and simulation, we show that a detector bias retarding the ions or an increase of the B-field of the IonCCD can efficiently suppress the artifact, which is necessary for quantitative mass spectrometry.

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“…The two basic approaches used for 3D-MS imaging are, first, depth profiling using an ionization source that ablates tissue and second, recording a sequence of 2D images from serial sections taken from a tissue volume and then combining this information. In the depth profiling experiments, ablation of the tissue material is used to expose lower layers of tissue for analysis; this has been achieved with high energy ion beams in secondary ion mass spectrometry (SIMS) imaging [29,33,35] or with lasers in methods that include matrix assisted laser desorption (MALDI) [5,36,37], laser ablation electrospray ionization (LAESI) [28,38], and laser ablation followed by atmospher-ic-pressure afterglow (LA-FAPA) [39]. In the alternative serial-sectioning approach, a volume of tissue is sliced into thin sections and each of the sections is imaged using standard 2D-MS imaging.…”

Section: Introductionmentioning

confidence: 99%

Data Processing for 3D Mass Spectrometry Imaging

Xiong

Eberlin

et al. 2012

J. Am. Soc. Mass Spectrom.

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Data processing for three dimensional mass spectrometry (3D-MS) imaging was investigated, starting with a consideration of the challenges in its practical implementation using a series of sections of a tissue volume. The technical issues related to data reduction, 2D imaging data alignment, 3D visualization, and statistical data analysis were identified. Software solutions for these tasks were developed using functions in MATLAB. Peak detection and peak alignment were applied to reduce the data size, while retaining the mass accuracy. The main morphologic features of tissue sections were extracted using a classification method for data alignment. Data insertion was performed to construct a 3D data set with spectral information that can be used for generating 3D views and for data analysis. The imaging data previously obtained for a mouse brain using desorption electrospray ionization mass spectrometry (DESI-MS) imaging have been used to test and demonstrate the new methodology.

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Static secondary ion mass spectrometry (S-SIMS) Part 2: material science applications

Cited by 76 publications

References 169 publications

Molecular information in static SIMS for the speciation of inorganic compounds

Molecular information in static SIMS for the speciation of inorganic compounds

IonCCD Detector for Miniature Sector-Field Mass Spectrometer: Investigation of Peak Shape and Detector Surface Artifacts Induced by keV Ion Detection

Data Processing for 3D Mass Spectrometry Imaging

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