State‐of‐the‐art of Multilayer Optics for Laboratory X‐ray Devices

Abstract

Multilayer X-ray optics with single layers of a few nanometers thickness can be obtained nowadays. These optics are used in X-ray diffractometers (XRD), X-ray fluorescence spectrometers (XRF) and at synchrotron sources. A detailed description of the production of multilayer X-ray optics using sputter deposition methods is presented and the simulation of X-ray optics and characterization with X-ray analytical measurements are explained. Finally, the advantages of multilayer X-ray optics in typical X-ray analytical applications are summarized.

Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II

“…Laterally graded multilayer mirrors, for example, have been used to increase the bandwidth (to Á/ ' 10 À3 ) of beamline monochromators. Their use as collimators (Goebel mirrors) in conventional X-ray sources has also been widely employed to improve the intensity in powder diffraction experiments (Hertlein et al, 2005;Shymanovich et al, 2008).…”

“…The challenge in fabricating a mirror with an aspherical surface figure can be solved by using Lshaped laterally graded multilayer mirrors which combine two one-dimensionally figured multilayer mirrors mounted 90 to each other (called Montel or nested mirror). Such a kind of mirror has been used in commercial diffractometers (Hertlein et al, 2005;Shymanovich et al, 2008). Reflective L-shaped mirrors have also been tested recently with neutron sources (Ice et al, 2009) and X-ray sources (Liu et al, 2011).…”

Tracing X-rays through an L-shaped laterally graded multilayer mirror: a synchrotron application

“…Laterally graded multilayer mirrors, for example, have been used to increase the bandwidth (to Á/ ' 10 À3 ) of beamline monochromators. Their use as collimators (Goebel mirrors) in conventional X-ray sources, to improve the intensity in powder diffraction experiments, has also been reported (Hertlein et al, 2005;Shymanovich et al, 2008).…”

“…Lshaped laterally graded multilayer mirrors provide a solution to this problem by combining two one-dimensionally figured multilayer mirrors at 90 to each other. Such types of mirror have been used in commercial powder diffratometers (Hertlein et al, 2005;Shymanovich et al, 2008) and also with neutron sources (Ice et al, 2009). By having two diffractions at each surface ( Fig.…”

X‐ray Diffraction Mapping for Cultural Heritage Science: a Review of Experimental Configurations and Applications

“…For X-ray anode sources, selection of the most intense emission line is made by suppressing other unwanted emission lines and part of the background continuum with ar elevant filter (Figure 9b2). As an example, a5 0mm Zr foil can be used to suppress the unwanted Mo Kb line from Mo Ka ,w hereas a1 5mm Ni foil strongly attenuates Cu Kb with respect to Cu Ka .A lternatively to metal foils, energy selection can be achievedt ogetherw ith beam focusing by making use of Montelm ultilayer optics [32] combined with ac ollimator, [12d] or with doubly curved crystal optics. [33] In somec ases,a nd specifically for (SR-based) mXRD mapping when the beam size is comparable to the crystallite size, the use of aw hite beam (DE/E % 2-4) is preferred or is used in combination with am onochromatic beam (DE/E % 10 À4 ).…”