Synchrotron X-ray tests of an L-shaped laterally graded multilayer mirror for the analyzer system of the ultra-high-resolution IXS spectrometer at NSLS-II

Abstract

Characterization and testing of an L-shaped laterally graded multilayer mirror are presented. This mirror is designed as a two-dimensional collimating optics for the analyzer system of the ultra-high-resolution inelastic X-ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS-II). The characterization includes point-to-point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X-ray test of the mirror was carried out reversely as a focusing device. The results show that the L-shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS-II.

Materials characterization by synchrotron x-ray microprobes and nanoprobes

“…Real optics are also limited by imperfections such as aberrations, mirror shape errors, roughness or nonuniformities, and further experimental instabilities such as vibrations and drifts (Tucoulou et al, 2008;Honnicke et al, 2011). For simplicity, all these effects can be included in a global resolution limit, namely, s I .…”

Compact pseudo-2D strip detector system for sub-meV IXS

“…In the IXS beamline, 5-10 mrad of scattered x-rays are collected from the sample using a multilayer mirror at 200 mm distance, which generates a 1-2 mm beam, collimated to within 100 μrad [4]. This collected beam is incident upon a set of three types of silicon crystals which includes collimator (C), dispersion element (D) and wavelength selector (W).…”

Micro- and Nano-X-ray Beams

“…Thus, the development of long beamlines allows today large source size demagnifications (emblematic in this regard is the construction of a 1 km long beamline at the Japanese synchrotron Spring-8) [14]. [15,16]. [15,16].…”