State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit

Atobe, Yuta; Shi, Youhua; Yanagisawa, Masao; Togawa, Nozomu

doi:10.1109/apccas.2012.6419108

Cited by 14 publications

(9 citation statements)

References 7 publications

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“…Using the historic state of CUT to obfuscate the scan data has also been proposed in [25]. The recovery of original output response from the obfuscated test data is a concern without a clear elaboration on how the obfuscation was controlled by the historic state.…”

Section: Related Workmentioning

confidence: 99%

“…The area overhead, security and impact on testability of the proposed secure design are also compared with other lock and key schemes in Table II. The compared scan protection schemes include SOSD-128 [20], DOSD-128 [22], ROS [19], SDSFF [25], Vim-Scan [33], SSTKR [32], TSC [21], DOS [30] and SIE [31]. ROS-16c refers to the ROS design [19] with 16 sub-chains.…”

Section: Table II Comparison Of Lock and Key Schemesmentioning

confidence: 99%

See 1 more Smart Citation

A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

Cui

Chang

Zhou

et al. 2021

IEEE Trans. Emerg. Topics Comput.

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Section: Related Workmentioning

confidence: 99%

Section: Table II Comparison Of Lock and Key Schemesmentioning

confidence: 99%

A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

Cui

Chang

Zhou

et al. 2021

IEEE Trans. Emerg. Topics Comput.

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“…Instead of inserting inverters or XOR gates into the scan chain, [28], [29] proposes the State Dependent Scan Flip-Flop (SDSFF) to replace traditional SFF in the scan chain. As shown in Figure 7, in SDSFF, an XOR gate and a latch are integrated into the traditional SFF.…”

Section: State Dependent Scan Flip-flop Based Scanmentioning

confidence: 99%

“…Although attackers can get access to the scan chain, the effective information cannot be obtained from the obfuscated data any more. Specifically, in this paper, eleven common secure scan designs using this strategy is introduced: Flipped Scan [24], XOR Scan [25], Double Feedback XOR Scan [26], rXOR Scan [27], State Dependent Scan Flip-Flop [28], [29], Dynamically Obfuscated Scan [30], [31], Test Key Integrated Scan [32]- [35], Sub-chains based Scan [36]- [39], Static and Dynamic Obfuscation of Scan [40], [41], and Partial Secure Scan [42], [43]. The second is scan input/output restriction.…”

Section: Introductionmentioning

confidence: 99%

Scan Chain Based Attacks and Countermeasures: A Survey

et al. 2019

IEEE Access

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Scan chains increase the testability but decrease security. Attackers may use scan chains to launch attacks to obtain sensitive information, which poses serious security threats. The scan chain-based attacks contain two steps: 1) scan data obtaining, including mode switching obtaining method and test mode only obtaining method, and 2) scan data analysis, including data mapping analysis method and signature analysis method. To prevent these attacks, various secure scan designs have been proposed. These designs are summarized into two categories: scan chain modification and scan input/output restriction. This paper gives a survey of the scan chain-based attacks and countermeasures. The secure scan designs are summarized and compared from the aspects of security, testability, test time, and hardware overhead.INDEX TERMS Scan chain based attacks, test mode, mode switch, signature, secure scan chain, secret key, physical unclonable function.

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“…In [59], a solution is proposed, which is based on the lock and key of physical unclonable function, but this design method has a particularly high hardware overhead. Some methods resist scan-based attacks by reordering scan chains [60][61][62][63][64][65][66][67][68][69].…”

Section: Introductionmentioning

confidence: 99%

Preventing Scan-Based Side-Channel Attacks by Scan Obfuscating with a Configurable Shift Register

Wang

Yin

Cai

et al. 2021

Security and Communication Networks

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Scan test is widely used in integrated circuit test. However, the excellent observability and controllability provided by the scan test gives attackers an opportunity to obtain sensitive information by using scan design to threaten circuit security. Hence, the primary motivation of this paper is to improve the existing DFT technique, i.e., to enhance the chip security on the premise of guaranteeing test quality. In this paper, we propose a new scan design method against scan-based side-channel attack. In the proposed method, the encryption structure is adopted, which requires the correct test authorization code to carry out normal test operation. Without the correct test authorization, the attackers cannot obtain the desired scan data, preventing the scan-based side-channel attacks. Furthermore, the test authorization code is determined by the nonvolatile memory built into the chip to realize the inconsistency of the test authorization code for each chip.

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State dependent scan flip-flop with key-based configuration against scan-based side channel attack on RSA circuit

Cited by 14 publications

References 7 publications

A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

A New PUF Based Lock and Key Solution for Secure In-Field Testing of Cryptographic Chips

Scan Chain Based Attacks and Countermeasures: A Survey

Preventing Scan-Based Side-Channel Attacks by Scan Obfuscating with a Configurable Shift Register

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