Stacking faults in SiC crystal grown by spontaneous nucleation sublimation method

Hu, Xiaobu; Xu, Xiaofeng; Li, Xianxiang; Jiang, Shouzheng; Li, Juan; Wang, Li; Wang, Jing; Jiang, Mihua

doi:10.1016/j.jcrysgro.2006.04.005

Cited by 17 publications

(8 citation statements)

References 9 publications

(9 reference statements)

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“…Finally in case of sample heat treated at 900ºC (Figure 3. E), particles preserved the prismatic shape and from the high resolution scale (Figure 3.F); we have observed that some step or terrace like pattern formed over the surface of the nano particle with rhombohedral shape which can be attributed due to the formation of stacking fault like defect A similar type of stacking fault has also been observed in case of SiC crystal grown by spontaneous nucleation sublimation method [48] Figure 4.A shows the mean particle number size distribution of the nano particles synthesized at different annealing temperature. For the at 250ºC annealed samples, the width of the distribution was very broad in comparison to the samples annealed from 300°C to 900ºC.…”

Section: Resultssupporting

confidence: 74%

Evolution of structural properties of iron oxide nano particles during temperature treatment from 250 °C–900 °C: X-ray diffraction and Fe K-shell pre-edge X-ray absorption study

Bora

Braun

Erat

et al. 2012

Current Applied Physics

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Iron oxide nano particles with nominal Fe 2 O 3 stoichiometry were synthesized by a wet, soft chemical method with the heat treatment temperatures from 250°C to 900°C in air. The variation in the structural properties of the nano particles with the heat treatment temperature was studied by X-ray diffraction and Fe K shell X -ray absorption study. X-ray diffractograms show that at lower annealing temperatures nano particle comprises both maghemite and hematite phases. With increasing temperature, the remainder of the maghemite phase transformed completely to hematite. Profile analysis of the leading Bragg reflections reveals that the average crystallite size increases from 50 nm to 150 nm with increasing temperature. The mean primary particle size decreased from 105 nm to 90 nm with increasing heat treatment temperature. The X-ray diffraction results are paralleled by systematic changes in the pre-edge structure of the Fe K-edge X-ray absorption spectra, in particular by a gradual decrease of the t 2g /e g peak height ratio of the two leading pre-edge resonances, confirming oxidation of the Fe from Fe 2+ towards Fe 3+ . Transmission electron microscopy (TEM) on the samples treated at temperatures as high as 900°Cshowed particles with prismatic morphology along with the formation of stacking fault like defects. High resolution TEM with selected area electron diffraction (SAED) of samples heat treated above 350°C showed that the nano particles have well developed lattice fringes corresponding to that of (110) plane of hematite.

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Section: Resultssupporting

confidence: 74%

Evolution of structural properties of iron oxide nano particles during temperature treatment from 250 °C–900 °C: X-ray diffraction and Fe K-shell pre-edge X-ray absorption study

Bora

Braun

Erat

et al. 2012

Current Applied Physics

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“…The crystals used in the experiments are 6H-SiC (0001) wafers grown by the sublimation method in our laboratory. The crystal growth procedure has been described in detail elsewhere (Hu et al, 2006). For evaluating the crystal quality, [0001]-orientated 6H-SiC samples were imaged by SWBXT in transmission mode.…”

Section: Methodsmentioning

confidence: 99%

Basal plane bending of 6H-SiC single crystals observed by synchrotron radiation X-ray topography

Ning

Wang

et al. 2009

J Appl Cryst

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Basal plane bending is a structural defect in SiC single crystals caused mainly by the thermal mismatch between seed and holder, which deteriorates the quality of the wafers and blocks their applications. In this paper, basal plane bending was detected by high‐resolution X‐ray diffractometry (HRXRD) and transmission synchrotron white‐beam X‐ray topography (SWBXT). HRXRD reveals that the (0001) Si face is a concave sphere and SWBXT shows that the shapes of the Laue spots are different from that of the cross section of the synchrotron radiation beam. On the basis of a spherical curvature model for a (0001) 6H‐SiC single crystal, the shapes of the Laue spots were simulated. The results are in good agreement with the experimental observations. Thus, SWBXT is an effective method for detecting basal plane bending.

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“…The 6H-SiC samples were grown by the sublimation method. The crystal growth procedure has been described in detail elsewhere (Hu et al, 2006). For microscopic observation, the as-grown crystal ingot was cut into h0001i-oriented wafers and then processed.…”

Section: Experimental Observationmentioning

confidence: 99%

Birefringence images of micropipes viewed end-on in 6H-SiC single crystals

Ning

Chen

et al. 2008

J Appl Cryst

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The nature of the micropipe, a fatal defect in SiC-based device applications, is still not fully understood. In this work, the birefringence images of micropipes in 6H-SiC crystals along the c axis have been observed and simulated in detail. Based on Frank's theory, the intensity contours of birefringence images for micropipes viewed end-on in 6H-SiC crystals have been derived by considering the photoelastic anisotropy of silicon carbide. The results are in good agreement with experimental observations. research papers J. Appl. Cryst. (2008). 41, 939-943 Lina Ning et al. Birefringence images of micropipes 943

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Stacking faults in SiC crystal grown by spontaneous nucleation sublimation method

Cited by 17 publications

References 9 publications

Evolution of structural properties of iron oxide nano particles during temperature treatment from 250 °C–900 °C: X-ray diffraction and Fe K-shell pre-edge X-ray absorption study

Evolution of structural properties of iron oxide nano particles during temperature treatment from 250 °C–900 °C: X-ray diffraction and Fe K-shell pre-edge X-ray absorption study

Basal plane bending of 6H-SiC single crystals observed by synchrotron radiation X-ray topography

Birefringence images of micropipes viewed end-on in 6H-SiC single crystals

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