2012
DOI: 10.1109/jsen.2011.2124453
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Spin-Transfer Torque MRAMs for Low Power Memories: Perspective and Prospective

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Cited by 46 publications
(30 citation statements)
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“…An STT-RAM based cache provides an inherent trade-off between write latency and read latency. A typical transistor and magnetic tunnel junction (MTJ) cell is shown in Figure 19a [57]. The magnetic tunnel junction is the basic storage device in the spintronic field that provides data non-volatility, fast data access, and low-voltage operation.…”
Section: Spin Transfer Torque Memorymentioning
confidence: 99%
“…An STT-RAM based cache provides an inherent trade-off between write latency and read latency. A typical transistor and magnetic tunnel junction (MTJ) cell is shown in Figure 19a [57]. The magnetic tunnel junction is the basic storage device in the spintronic field that provides data non-volatility, fast data access, and low-voltage operation.…”
Section: Spin Transfer Torque Memorymentioning
confidence: 99%
“…As a result, shown in Figure 1, hybrid main memory using DRAM and NVRAM seems to be practicable instead of pure NVRAM-based main memory in the near future. Some recent studies have introduced NVRAM-based main memory organization [13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28][29]. However, legacy bandwidth-aware multi-core scheduling methods can not applicable with the DRAM/NVRAM hybrid main memory.…”
Section: Nvram Technologymentioning
confidence: 99%
“…Recently, the next generation Non-volatile Random Access Memory (NVRAM) technology such as PRAM, STT-MRAM and ReRAM have developed significantly [13][14][15][16]. In June 2016, for example, IBM and Samsung demonstrated MRAM cells for devices with diameters ranging from 50 down to 11 nanometers in only on nanoseconds [17].…”
Section: Introductionmentioning
confidence: 99%
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“…As a result, we should adapt existing DRAM power management schemes in software to account for these variations in power consumption. Moreover, this layer should be flexible enough to deal with a predicted increase in power variation for current [28] and emerging [66,1] memory technologies (e.g., phasechange memory).…”
Section: Introductionmentioning
confidence: 99%