2000
DOI: 10.1080/13642810008208608
|View full text |Cite
|
Sign up to set email alerts
|

Spin-polarized tunnelling, magnetoresistance and interfacial effects in ferromagnetic junctions

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

3
31
0

Year Published

2002
2002
2019
2019

Publication Types

Select...
5
1

Relationship

0
6

Authors

Journals

citations
Cited by 40 publications
(34 citation statements)
references
References 57 publications
3
31
0
Order By: Relevance
“…The Al 2 O 3 tunnel barriers obtained by oxidation of the Al film are amorphous 8,10 . Concerning the α-Al 2 O 3 crystals, it is known from the band structure calculations 29 that the gap (which is not direct) between the upper valence band and the conduction band is of the width of ≈ 6.29 eV.…”
Section: Theoretical Modelmentioning
confidence: 99%
See 4 more Smart Citations
“…The Al 2 O 3 tunnel barriers obtained by oxidation of the Al film are amorphous 8,10 . Concerning the α-Al 2 O 3 crystals, it is known from the band structure calculations 29 that the gap (which is not direct) between the upper valence band and the conduction band is of the width of ≈ 6.29 eV.…”
Section: Theoretical Modelmentioning
confidence: 99%
“…Experimentally it was observed 5,7,8 that the TMR depends critically on the material of the insulating barrier and on the conditions of its preparation, in particular on the imperfections of the interfaces between the metal and the insulating layer 9,10 . On the other hand, the first theory suggested by M. Julliere expresses the TMR ratio in terms of the effective spin polarizations P 1 and P 2 of two magnetic layers via the expression TMR = 2P 1 P 2 /(1 + P 1 P 2 ), and thus predicts no dependence of the TMR on the parameters of the barrier.…”
Section: Introductionmentioning
confidence: 99%
See 3 more Smart Citations