1980
DOI: 10.1016/0040-6090(80)90237-0
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Spectroscopy of the deep levels in tin-doped Ga-Al-As

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Cited by 17 publications
(6 citation statements)
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“…Besides, the photo electric memcapacitors require only small AC voltages for the capacitance detection. [31][32][33][34][35] With this consideration, we design a planar Au/ La 1.875 Sr 0.125 NiO 4 (LSNO)/Au MSM structure (Figure 1b) for the demonstration of photoelectric memcapacitors. In addition, the photo electric memcapacitors can be made with a planar metal/semiconductor/metal (MSM) structure, which has many advantages, including simple device structure, large photosensing area, ultralow leakage current, and high sensitivity.…”
Section: Wwwadvelectronicmatdementioning
confidence: 99%
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“…Besides, the photo electric memcapacitors require only small AC voltages for the capacitance detection. [31][32][33][34][35] With this consideration, we design a planar Au/ La 1.875 Sr 0.125 NiO 4 (LSNO)/Au MSM structure (Figure 1b) for the demonstration of photoelectric memcapacitors. In addition, the photo electric memcapacitors can be made with a planar metal/semiconductor/metal (MSM) structure, which has many advantages, including simple device structure, large photosensing area, ultralow leakage current, and high sensitivity.…”
Section: Wwwadvelectronicmatdementioning
confidence: 99%
“…The functioning of photoelectric memcapacitors relies on the persistent photocapacitance (PPC) effect. A significant PPC effect can be achieved if the charge carriers in either the bulk or interface region of an MSM structure are modulatable by light stimuli via slow charge trapping/detrapping processes . With this consideration, we design a planar Au/La 1.875 Sr 0.125 NiO 4 (LSNO)/Au MSM structure (Figure 1b) for the demonstration of photoelectric memcapacitors.…”
Section: Comparison Of Device Structure and Performance Between The Pmentioning
confidence: 99%
“…Because of 0C the very low peak temperatures and the carrier freeze-out problem mentioned earlier, it is difficult to E capture these peaks in DLTS. Balland U. et al[4], however, have reported a o0 peak in addition to the main peak of the Sn-DX center in current DLTS (but not observed in capacitance DLTS).…”
mentioning
confidence: 77%
“…(1) and (2) can be described by ... (4) As the capacitance goes through a step, the ratio of conductance frequency (G/W) goes through a peak at the frequency W. = 1/Teff It may noted that even though T and Tfef are different, the activation energy to be of Toff would be the same as that of T , if n and nT are temperature independent. This is normally the case for many semiconductors in which the free carriers are supplied by a shallow level, and the deep level is not significantly ionized in the neutral material in the temperature range of interest.…”
Section: Discussionmentioning
confidence: 98%
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