1981
DOI: 10.1002/pssa.2210680238
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Sn-X centers in GaAlAs thin layer emitters

Abstract: Different thin film GaAlAs structures (Schottky diodes) with various Sn concentration are studied. Their behaviour is similar to electroluminescent emitters (LED and laser diodes). I t is observed that Sn controls the behaviour of the layers if z > 0.15. The deep level spectroscopy shows the existence of various donor-levels associated with the Sn impurity. Their concentration is correlated to the amount of Sn introduced into the epitaxial growth solution. These centers show the D-X center characteristics (in … Show more

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Cited by 7 publications
(4 citation statements)
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References 15 publications
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“…This is supported by photoconductivity and DLTS measurements [7] and by capture data reported, e.g. [4]. That means the PPC effect in n-type Al0.35Ga0.65Αs:Sn at and above TLN is mainly related to DX2 and not to the dominant trap DX1.…”
Section: Discussionsupporting
confidence: 64%
See 1 more Smart Citation
“…This is supported by photoconductivity and DLTS measurements [7] and by capture data reported, e.g. [4]. That means the PPC effect in n-type Al0.35Ga0.65Αs:Sn at and above TLN is mainly related to DX2 and not to the dominant trap DX1.…”
Section: Discussionsupporting
confidence: 64%
“…The DX1 should be the main Sn-related DX centre (Εt,1 = 0.19.. .0.21 eV, e.g. [4]). The low-temperature part of spectum (a) was recorded under non-saturation conditions.…”
Section: (239)mentioning
confidence: 99%
“…This is supported by photoconductivity and DLTS measurements [7] and by capture data reported, e.g. [4]. That means the PPC effect in n-type Al0.35Ga0.65Αs:Sn at and above TLN is mainly related to DX2 and not to the dominant trap DX1.…”
Section: Discussionsupporting
confidence: 62%
“…dégradation homogène (absence de lignes noires) d'abord rapide (pendant 200 à 300 h), puis plus lente. Pour celles-ci, nous avons suivi les évolutions de la puissance lumineuse émise pour une densité de courant de 50 A/CM2 et de la concentration de centres profonds mesurée par les techniques de capacité et de courant transitoires[10,11,12]. 2.…”
unclassified