2019
DOI: 10.1016/j.apsusc.2019.06.199
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Spectroscopic study on amorphous tantalum oxynitride thin films prepared by reactive gas-timing RF magnetron sputtering

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Cited by 12 publications
(9 citation statements)
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“…The thickness of the native oxide on silicon surface possibly originated from moister and oxygen in air is fixed at 2 nm. [21,23,24] The effective thickness (d eff ) and the effective dielectric function (𝜖 eff ) related to localized plasmonic resonance properties of ZrN films are determined through a combination of Drude model and Gaussian formula as presented in Figure 2b which is an analyzed result of optimized Au films (Figure S7, Supporting Information) . [31,32] Note that the optimization of the sputtered Au thin film related to spectroscopy enhancement can see elsewhere.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The thickness of the native oxide on silicon surface possibly originated from moister and oxygen in air is fixed at 2 nm. [21,23,24] The effective thickness (d eff ) and the effective dielectric function (𝜖 eff ) related to localized plasmonic resonance properties of ZrN films are determined through a combination of Drude model and Gaussian formula as presented in Figure 2b which is an analyzed result of optimized Au films (Figure S7, Supporting Information) . [31,32] Note that the optimization of the sputtered Au thin film related to spectroscopy enhancement can see elsewhere.…”
Section: Resultsmentioning
confidence: 99%
“…[3,13] V. Yordsri National Metal and Materials Technology Center (MTEC) NSTDA 111 Thailand Science Park, Paholyothin Rd., Klong Nueng, Klong Luang, In this study, we fabricate ZrN thin film SERS substrate using reactive gas-timing (RGT) rf magnetron sputtering technique. [5,15,[20][21][22][23][24] The tailored properties of ZrN thin film exploited for SERS activity could be achieved by controlling an amount of sputtered atom from the target and enriching sputtered energy through a turn-on timing of Ar sequence variation. [5,15,20,22] We find that the spatially plasmonic hotspots on the surface of ZrN SERS substrate, resulting from the discrete conductive surface profile, strongly relate to non-stoichiometric composition and the degree of (200)-oriented texture at the surface of ZrN thin film.…”
Section: Introductionmentioning
confidence: 99%
“…O1 s spectra of NPT25 and NPT65 samples (Figure c,e) revealed two peaks at 530.3 and 530.2 eV for NPT25 and NPT65, respectively. These peaks belonged to Ta 2 O 5 , while deconvolution of the peaks revealed Ta─OH at 531.2 and 532.1 eV for NPT25 and NPT65 samples, respectively (Lertvanithphol et al, ; Pan et al, ).…”
Section: Resultsmentioning
confidence: 99%
“…ZnO-NRs were grown on the Ag film via the seed-assisted hydrothermal process, as shown in Figure . First, the Ag seed layer with a thickness of 200 nm was deposited on the (111) Si substrate using the gas-timing (GT) rf magnetron sputtering technique. − It should be noted that 10 nm of the titanium (Ti) film was utilized as a buffer layer between the Si and Ag seed layer to adhere the Ag film on the surface of the substrate. The peak intensity ratio between the (111) and (200) planes of the Ag seed layer ( I (111)/(200) ratio) was widely varied from 2.9 to 40.8, providing the texture orientation along the (111) plane of Ag in the range of 74.4–97.6%.…”
Section: Methodsmentioning
confidence: 99%