1992
DOI: 10.1557/jmr.1992.0164
|View full text |Cite
|
Sign up to set email alerts
|

Spectroscopic studies of the structure of amorphous and microcrystalline SiC prepared by the polymer route

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

1
1
0

Year Published

1997
1997
2023
2023

Publication Types

Select...
3
2

Relationship

0
5

Authors

Journals

citations
Cited by 12 publications
(2 citation statements)
references
References 7 publications
1
1
0
Order By: Relevance
“…The three sharp peak positions agree with the carbon sites in 6H-SiC or 15R-SiC superposed with fI-SiC structure for which the resonance position will be close to 23.7 ppm [10]. The broad resonance line around 133 ppm is characteristic of aromatic carbon [1] but the behavior above 1200~ suggests also the presence of amorphous SiC. Increasing the annealing temperature leads to a development of a broad peak at 33 ppm and lowering of the structured band related to et-SiC structure.…”
Section: Si and 13c Mas Nmr Characterizationssupporting
confidence: 70%
See 1 more Smart Citation
“…The three sharp peak positions agree with the carbon sites in 6H-SiC or 15R-SiC superposed with fI-SiC structure for which the resonance position will be close to 23.7 ppm [10]. The broad resonance line around 133 ppm is characteristic of aromatic carbon [1] but the behavior above 1200~ suggests also the presence of amorphous SiC. Increasing the annealing temperature leads to a development of a broad peak at 33 ppm and lowering of the structured band related to et-SiC structure.…”
Section: Si and 13c Mas Nmr Characterizationssupporting
confidence: 70%
“…Electron paramagnetic resonance (EPR) technique is a suitable tool in identifying the paramagnetic defects involved in the network. The type of defects, their local structural environments as well as their concentration could be inferred from EPR measurements [1][2][3][4].…”
Section: Introductionmentioning
confidence: 99%