Spectroscopic ellipsometry and the Fano resonance modeling of graphene optical parameters

Optical Third-Harmonic Generation in Graphene

“…Using the reflected field from Eq. (1b) to calculate the intensity I / jE k R j 2 as a function of graphene layer number N, and making use of the optical constants of graphene at the fundamental and TH wavelengths [15], n Gr ð Þ % 3 þ 1:5i and n Gr ð =3Þ % 2 þ 3i, respectively, and a slab thickness d ¼ 3:35N # A, we calculate a signal ratio of 3.7 between the bilayer and monolayer regions, in close agreement with our results. As a check, these constants are used to calculate normal-incidence reflectance and transmittance values using the linear optical analogue of either Eq.…”

“…These properties include relatively flat optical absorption from around 0.5 to 1.5 eV, with a strong dopingdependent absorption edge and pronounced excitonic effects [5][6][7][8][9]; coupling of optical and mechanical properties in graphene membranes [10]; and plasmonic properties [11,12]. Such studies have underscored the importance of the linear optical properties of graphene [5][6][7][8][9][13][14][15]. In addition, measurements of optical carrier generation in graphene have led to the observation of strong hot-electron photoluminescence as well as new scattering phenomena involving highly excited carriers [16][17][18].…”

Calculation of dielectric constant of buffer layer graphene on SiC measured by spectroscopy ellipsometry using Gauss-Newton numerical inversion method

“…It can be mentioned that due to this constant value of dielectric constant, the buffer layer graphene might become transparent. Regarding the value of dielectric constant, it might be said that the thickness of our grown buffer layer graphene might be between 0.5 ML and 1 ML since the dielectric constant of bulk SiC substrate is lied in the range of 0 to 12 while the dielectric constant of graphene is lied around -5 to 15 [4][5][6][7][8][9][10]. However, detail spectroscopic ellipsometry experiment, for example by varying the incident angles, would help in determining the exact thickness of our buffer layer graphene.…”

“…The inversion method has been carried out by Kravets et al [3] and Matkovic et al [4,5] while Santoso et al [6,7,9], Boosalis et al [8], and Gogoi et al [10] have employed the modeling of a dielectric constant method to calculate the refractive index and dielectric constant of nanostructured graphene from measured spectroscopy ellipsometry data using Drude-Lorentz model and model dielectric function.…”

Morphology and optical constants of nanographite films created by thermal vacuum deposition

“…Because of the different structure and other defects, optical constants of semitransparent films are different from those for bulk materials. It turned out that the complex refractive index of nanographite layer at the optical wavelength λ = 632.8 nm was less than the corresponding bulk material parameter (for example, [7,8]) due to porosity of the composite layer of material. Using optical parameters of the structure, determined by the multi-angle ellipsometry method, the fraction of solid phase f of nanographite layer was determined.…”