1972
DOI: 10.1364/ao.11.002294
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Spectrophotometer Linearity Testing Using the Double-Aperture Method

Abstract: The double-aperture method has been used to determine the nonlinearity correction for a new spectrophotometer having a precision of +/-4 x 10(-5) transmittance units. The random and systematic errors of the method are discussed, and techniques are described that yield the additive nonlinearity correction to the high level of precision required for this spectrophotometer. The correction was found to be independent of source polarization, free from interference errors, but slightly dependent on wavelength.

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Cited by 83 publications
(48 citation statements)
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“…Admittedly these are the extreme cases. For some ideas on how to evaluate the possible errors in linearity measurements due to coherence, see Born and Wolf [15], Mielenz and Eckerle [16], and Bures and Delisle [17].…”
Section: N+n2•mentioning
confidence: 99%
“…Admittedly these are the extreme cases. For some ideas on how to evaluate the possible errors in linearity measurements due to coherence, see Born and Wolf [15], Mielenz and Eckerle [16], and Bures and Delisle [17].…”
Section: N+n2•mentioning
confidence: 99%
“…The transmittance measured for three and four filters was found to be: [7,8] 10 mm by 18 mm in the center of the 50.8 mm diameter port. This allows for the complete return of the reflected signal from within most nearly opaque samples without losses caused by the port edge being too close to the area of illumination.…”
Section: Wavelengthmentioning
confidence: 95%
“…The values for Qv are used in eq. (4) The linearity of the detector and electronic system was determined by using the lightaddition method with a double-aperture apparatus [4,10], that is, the output of the detector system when irradiated by two light beams simultaneously is compared to the sum of the outputs obtained when the detector is irradiated by each light beam separately. Measurements were also made of the signal as a function of time.…”
Section: Reflectance Measurement Proceduresmentioning
confidence: 99%
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“…Since the linearity is, within 1 part in 1()4, not usually a function of wavelength [36], all measurements were performed at A 565.0 nm. A recent study of this parameter at NBS by Mielenz and Eckerle indicates that there may be a relation between wavelength and linearity at the level of 1 part in 1 (» [38].…”
Section: Linearity Controlmentioning
confidence: 98%