Spectral profile of the two-photon absorption coefficients in CaF2 and BaF2

Tsujibayashi, Toru; Toyoda, K.; Sakuragi, Shiro; Kamada, Masao; Itoh, Minoru

doi:10.1063/1.1471939

Cited by 36 publications

(21 citation statements)

References 9 publications

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“…3,4,22 Görling et al verified that STE formation requires twophoton excitations at both 193 and 157 nm and estimated the two-photon absorption cross sections. 3,4,22 Görling et al verified that STE formation requires twophoton excitations at both 193 and 157 nm and estimated the two-photon absorption cross sections.…”

Section: Discussionmentioning

confidence: 99%

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Effect of surface treatments on self-trapped exciton luminescence in single-crystal CaF2

Cramer

Cumby

Leraas

et al. 2005

Journal of Applied Physics

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We show that near-surface defects produced by mechanical treatments and electron irradiation can significantly enhance the intensity of luminescence due to the decay of self-trapped excitons ͑STEs͒ in single-crystal calcium fluoride during 157-and 193-nm irradiation. For example, polishing can double the intensity of the STE luminescence. Defects produced by mechanical indentation can either increase or decrease the luminescence intensity, depending on the indentation force. Electron irradiation also enhances subsequent STE luminescence. When electron-irradiated samples are annealed, additional increases in luminescence intensity are observed. Plausible mechanisms for the observed effects on STE luminescence intensity are discussed.

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Section: Discussionmentioning

confidence: 99%

“…Although nominally transparent at these wavelengths, defects generated by two-photon absorption 3,4 can potentially degrade optical performance. It is currently employed in photolithography at 193 nm and is an important candidate material for use at 157 nm.…”

Section: Introductionmentioning

confidence: 99%

Effect of surface treatments on self-trapped exciton luminescence in single-crystal CaF2

Cramer

Cumby

Leraas

et al. 2005

Journal of Applied Physics

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“…The β value of our SWNT thin film is about two orders of magnitude greater than those of CaF 2 and BaF 2 crystals, 19 which have been widely used as optical windows and achromatic lenses. Our value of β is also large compared with those obtained for multi-walled carbon nanotube (MWNT) films, 6 silicon nanocrystals, 12 and…”

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confidence: 99%

Nonlinear optical absorption and reflection of single wall carbon nanotube thin films by Z-scan technique

Shimamoto

Sakurai

Itoh

et al. 2008

Applied Physics Letters

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Both the nonlinear optical transmission and reflection characteristics of HiPco-based single wall carbon nanotube (SWNT) thin films are studied by using the Z-scan method with femtosecond laser pulses at a wavelength of 1.46 μm. The nonlinear absorption coefficient and nonlinear refractive index are obtained as (5.4 ± 2.0) × 10 −7 cm/W and (1.1 ± 0.5) × 10 −11 cm 2 /W, respectively, which are considerably greater than those of other optical materials. This large optical nonlinearity is ascribed to (a) homogeneously deposited thin nanotube film on optically transparent barium fluoride, (b) just-resonant excitation condition, and (c) intrinsic saturable absorption feature of SWNTs.

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“…The two investigated samples exhibit very low k values in the low 10 -4 cm -1 range and also low β eff data of 1.7 and 1.75*10 -9 cm/W. The latter seems to be a lower limit for nanosecond laser pulses 16,17 . In contrast to CaF 2 the fluence dependent absorption coefficient of fused silica at 193 nm does not show a linear dependence for a wide range of low fluences 12 .…”

Section: Measurement Resultsmentioning

confidence: 97%

Laser induced deflection (LID) method for absolute absorption measurements of optical materials and thin films

2011

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We use optimized concepts to measure directly low absorption in optical materials and thin films at various laser wavelengths by the laser induced deflection (LID) technique. An independent absolute calibration, using electrical heaters, is applied to obtain absolute absorption data without the actual knowledge of the photo-thermal material properties. Verification of the absolute calibration is obtained by measuring different silicon samples at 633 nm where all laser light, apart from the measured reflection/scattering, is absorbed. Various experimental results for bulk materials and thin films are presented including measurements of fused silica and CaF 2 at 193 nm, nonlinear crystals (LBO) for frequency conversion and AR coated fused silica for high power material processing at 1030 nm and Yb-doped silica raw materials for high power fiber lasers at 1550 nm. In particular for LBO the need of an independent calibration is demonstrated since thermal lens generation is dominated by stress-induced refractive index change which is in contrast to most of the common optical materials. The measured results are proven by numerical simulations and their influence on the measurement strategy and the obtained accuracy are shown.

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Spectral profile of the two-photon absorption coefficients in CaF2 and BaF2

Cited by 36 publications

References 9 publications

Effect of surface treatments on self-trapped exciton luminescence in single-crystal CaF2

Effect of surface treatments on self-trapped exciton luminescence in single-crystal CaF2

Nonlinear optical absorption and reflection of single wall carbon nanotube thin films by Z-scan technique

Laser induced deflection (LID) method for absolute absorption measurements of optical materials and thin films

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