Spectral Phase Shift of Surface Plasmon Resonance in the Kretschmann Configuration: Theory and Experiment

Hlubina, Petr; Ciprián, Dalibor

doi:10.1007/s11468-016-0360-9

Cited by 26 publications

(25 citation statements)

References 30 publications

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“…The starting parameters λ p , γ p , A j , λ j , and γ j in the modified Drude-Lorentz model according to Eq. (7) were taken from [24] and the values of the real and imaginary permittivity at a resonance wavelength of 606.35 nm thus obtained are -10.261 and 1.762, respectively. It is clearly seen that both curves in the fit agree well and the difference between them is only in a long wavelength range.…”

Section: Resultsmentioning

confidence: 99%

“…A fit according to the model function given by Eq. (7) is shown by a solid line, and also the real permittivity function corresponding to a model with parameters from [24] is included. Similarly, Fig.…”

Section: Resultsmentioning

confidence: 99%

“…where R p,s (λ) and ϕ p,s (λ) are the wavelength-dependent reflectances and phase changes on reflection for both polarizations. Because the p-polarized wave is subjected to the SPR phenomenon, both the reflectance ratio R p (λ)/R s (λ) and the phase difference ∆(λ) = ϕ p (λ) − ϕ s (λ) are changed significantly near a resonance wavelength [24]. The reflected light passes through linear analyzer A (LPVIS050, Thorlabs) oriented 45 • with respect to the plane of incidence so that por s-polarized components interfere and a channeled spectrum is resolved when the light is launched directly into a read optical fiber (M15L02, Thorlabs) of a spectrometer (USB4000, Ocean Optics).…”

Section: Experimental Methodsmentioning

confidence: 99%

“…The models describe the dispersion in the considered spectral region with different accuracy dependent on the number of parameters used. We prefer to use the Drude-Lorentz model with two additional Lorentzian terms [30,31] which proved to be effective in our previous works [22,24]. The wavelength dependence of the complex permittivity of gold is expressed as follows…”

Section: Theoretical Modelmentioning

confidence: 99%

“…Unfortunately, because this method is based on measuring the reflectance ratio for p and s polarizations, it is very sensitive to the birefringence properties of a read optical fiber. To overcome this limitation, we propose a phase sensitive measurement which has been utilized in our previous works [13,23,24].…”

Section: Introductionmentioning

confidence: 99%

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Phase sensitive measurement of the wavelength dependence of the complex permittivity of a thin gold film using surface plasmon resonance

Hlubina

Luňáčková

Ciprián

2019

Opt. Mater. Express

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We report on a new method for measuring the wavelength dependence of the complex permittivity of a thin gold film of a surface plasmon resonance (SPR) structure comprising a gold-coated SF10 slide with an adhesion film of chromium attached to an SF10 glass prism. The method is based on spectral interferometry and utilizes a setup with a birefringent crystal and the SPR structure in the Kretschmann configuration, in which channeled spectra are recorded and from them, the phase functions of the SPR for air at different angles of incidence are retrieved. The SPR phenomenon is manifested as an abrupt phase change with respect to the reference phase difference for the interference resolved with the SF10 glass prism alone. The phase changes for different angles of incidence are processed in the vicinity of the resonance wavelengths to obtain the real and imaginary parts of the complex permittivity in a wavelength range from 530 to 850 nm or equivalently, the parameters of a modified Drude-Lorentz model. This research, to the best of the authors' knowledge, is the first demonstration of spectral interferometry-based measurement of the complex permittivity function of a thin metal film, which is important from the point of view of material characterization directly performed in the Kretschmann configuration. The performance of the SPR sensor is strongly influenced by the choice of a thin metal film so it is crucial to know the complex permittivity function of the metal. Standard techniques to characterize thin metal films include spectral ellipsometry [15][16][17] and spectral reflectometry [18].

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Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

Section: Experimental Methodsmentioning

confidence: 99%