Abstract:We present a new method for measuring the group dispersion of the fundamental mode of a holey fiber over a wide wavelength range by white-light interferometry employing a low-resolution spectrometer. The method utilizes an unbalanced Mach-Zehnder interferometer with a fiber under test placed in one arm and the other arm with adjustable path length. A series of spectral signals are recorded to measure the equalization wavelength as a function of the path length, or equivalently the group dispersion. We reveal that some of the spectral signals are due to the fundamental mode supported by the fiber and some are due to light guided by the outer cladding of the fiber. Knowing the group dispersion of the cladding made of pure silica, we measure the wavelength dependence of the group effective index of the fundamental mode of the holey fiber. Furthermore, using a full-vector finite element method, we model the group dispersion and demonstrate good agreement between experiment and theory.

Abstract:We present a white-light spectral interferometric technique for measuring the absolute spectral optical path difference (OPD) between the beams in a slightly dispersive Michelson interferometer with a thin-film structure as a mirror. We record two spectral interferograms to obtain the spectral interference signal and retrieve from it the spectral phase, which includes the effect of a cube beam splitter and the phase change on reflection from the thin-film structure. Knowing the effective thickness and dispersion of the beam splitter made of BK7 optical glass, we use a simple procedure to determine both the absolute spectral phase difference and OPD. The spectral OPD is measured for a uniform SiO 2 thin film on a silicon wafer and is fitted to the theoretical spectral OPD to obtain the thin-film thickness. The theoretical spectral OPD is determined provided that the optical constants of the thin-film structure are known. We measure also the nonlinear-like spectral phase and fit it to the theoretical values in order to obtain the thin-film thickness.

We report on processing the spectral interference signals by a new method based on a windowed Fourier transform applied in the wavelength domain. First, the numerical simulations are performed to demonstrate high precision of the phase retrieval from the spectral signal. Second, the feasibility of the method is confirmed in processing experimental data from a dispersive Michelson interferometer comprising a cube beamsplitter made of BK7 glass. From the retrieved spectral phase difference, the effective thickness of the beamsplitter is determined precisely.

A new method for a precise measurement of the oscillatory part of phase change on reflection (interferometric phase) from a thin-film structure is presented. The method, which is based on phase retrieval from the spectral interferograms recorded at the output of a slightly dispersive Michelson interferometer, is combined with reflectometry. The interferometric phase of the thin-film structure is measured precisely using a reference sample of known phase change on reflection. The spectral reflectance of the thin-film structure is also measured in the interferometer. The feasibility of the method is confirmed in processing the experimental data for SiO 2 thin film on a silicon wafer of known optical constants. Four samples of the thin film are used and their thicknesses are determined. We confirm very good agreement between the thicknesses obtained from the interferometric phase and reflectance measurements.

We report on a simple spectral interferometric technique for chromatic dispersion measurement of a short length optical fibre including the zero-dispersion wavelength. The method utilizes a supercontinuum source, a dispersion balanced Mach-Zehnder interferometer and a fibre under test of known length inserted in one of the interferometer arms and the other arm with adjustable path length. The method is based on resolving one spectral interferogram (spectral fringes) by a low-resolution NIR spectrometer. The fringe order versus the precise wavelength position of the interference extreme in the recorded spectral signal is fitted to the approximate function from which the chromatic dispersion is obtained. We verify the applicability of the method by measuring the chromatic dispersion of two polarization modes in a birefringent holey fibre. The measurement results are compared with those obtained by a broad spectral range (500-1600 nm) measurement method, and good agreement is confirmed.

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Abstract:We report on a new and simple method for measuring the wavelength dependence of phase modal birefringence in a polarizationmaintaining fiber. The method is based on application of a lateral pointlike force on the fiber that causes strong coupling between polarization modes and utilizes their interference resolved as the channeled spectrum. The change of the phase retrieved from two recorded channeled spectra that are associated with the known displacement of coupling point is used to determine the phase modal birefringence as a function of wavelength. A windowed Fourier transform is applied to reconstruct precisely the phase change and the phase ambiguity is removed provided that we know the phase change of the spectral fringes at one specific wavelength. The measured wavelength dependence of phase modal birefringence is compared with that resulting from the group modal birefringence measurement.

A spectral method based on surface plasmon resonance (SPR) in air is used to measure the dielectric function of a thin metal film. The method utilizes the spectral dependence of the ratio of the reflectances of p- and s-polarized waves measured in the Kretschmann configuration at different angles of incidence. By processing these dependences in the vicinity of a dip, or equivalently near the resonance wavelength, and using the dispersion characteristics of a metal film according to a proposed physical model, the real and imaginary parts of the dielectric function of the metal can be determined. The corresponding dielectric function of the metal is obtained by a least squares method for such a thickness minimizing the difference between the measured and theoretical dependence of the resonance wavelength on the the angle of incidence. The feasibility of the method is demonstrated in measuring the dielectric function of a gold film of an SPR structure comprising an SF10 glass prism and a gold coated SF10 slide with an adhesion film of chromium. The dielectric function according to the Drude–Lorentz model with two additional Lorentzian terms was determined in a wavelength range from 534 to 908 nm, and the results show that the gold film is composed of homogenous and rough layers with thicknesses 42.8 nm and 2.0 nm, respectively. This method is particularly useful in measuring the thickness and dielectric function of a thin metal film of SPR structures, directly in the Kretschmann configuration.