Our system is currently under heavy load due to increased usage. We're actively working on upgrades to improve performance. Thank you for your patience.
Proceedings of the 6th IEEE/ACM/IFIP International Conference on Hardware/Software Codesign and System Synthesis 2008
DOI: 10.1145/1450135.1450167
|View full text |Cite
|
Sign up to set email alerts
|

Specification-based compaction of directed tests for functional validation of pipelined processors

Abstract: Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biased-random test programs. Although directed tests require a smaller test set compared to random tests to achieve the same functional coverage goal, there is a lack of automated techniques for directed test generation. Furthermore, the number of directed tests can still be prohibitively large. This paper presents a methodology for specif… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2010
2010
2019
2019

Publication Types

Select...
3
1
1

Relationship

2
3

Authors

Journals

citations
Cited by 8 publications
(3 citation statements)
references
References 18 publications
0
3
0
Order By: Relevance
“…One proposed approach is to compact directed tests from properties for validating a pipeline processor. This is achieved by analyzing the finite state machine model of the processor by identifying and removing redundant and unreachable states along with illegal transitions in order to minimize the overall state space of the model [Koo and Mishra 2008].…”
Section: Related Workmentioning
confidence: 99%
“…One proposed approach is to compact directed tests from properties for validating a pipeline processor. This is achieved by analyzing the finite state machine model of the processor by identifying and removing redundant and unreachable states along with illegal transitions in order to minimize the overall state space of the model [Koo and Mishra 2008].…”
Section: Related Workmentioning
confidence: 99%
“…In contrast to these test compaction approaches, a property compaction technique needs to be applied before test generation. Therefore, a test generator only needs to generate a reduced set of tests without sacrificing the coverage requirement [17]. This approach can reduce the generation cost as well as the overall validation effort.…”
Section: Functional Test Compactionmentioning
confidence: 99%
“…Due to the overlap between different fault models, some of the generated properties may lead to redundant tests. Therefore, property compaction can be employed to reduce the number of properties without affecting coverage goals [21].…”
Section: Coverage-driven Property Generationmentioning
confidence: 99%