2022
DOI: 10.1088/1361-648x/ac4937
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Spatially varying chemical phase formation on silicon nano ripple by low energy mixed ions bombardment

Abstract: We report mixed (CO+ and N2+) ion beam induced spatially varying chemical phases formation on Si (100) surface in nanometer length scale. Simultaneous bombardment of carbon, oxygen and nitrogen like three reactive ions leads to well-defined ripple development and spatially varying periodic chemical phases formation. Post bombardment chemical changes of Si surface are investigated by X-ray Photoelectron Spectroscopy (XPS), and spatially resolved periodic variation of chemical phases are confirmed by Electron En… Show more

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Cited by 1 publication
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“…These concepts were further employed for irradiating a Si surface with a mixed (CO + and N + 2 ) ion beam at θ = 60 • . The bombardment with three reactive ions, namely carbon, oxygen and nitrogen, leads to a ripple pattern and to the formation of spatially varying periodic chemical phases [237]. The composition of the chemical pattern was determined by XPS, STEM-high angle annual dark field and EELS.…”
Section: Chemical Patterningmentioning
confidence: 99%
See 1 more Smart Citation
“…These concepts were further employed for irradiating a Si surface with a mixed (CO + and N + 2 ) ion beam at θ = 60 • . The bombardment with three reactive ions, namely carbon, oxygen and nitrogen, leads to a ripple pattern and to the formation of spatially varying periodic chemical phases [237]. The composition of the chemical pattern was determined by XPS, STEM-high angle annual dark field and EELS.…”
Section: Chemical Patterningmentioning
confidence: 99%
“…Note the colour code for each region: green (mixture of silicon carbide, silicon oxide, silicon nitride and silicon oxynitride), yellow (mixture of silicon oxide, silicon nitride and silicon oxynitride) and purple (amorphous silicon). Reproduced from[237]. © IOP Publishing Ltd. All rights reserved.…”
mentioning
confidence: 99%