2020 IEEE Physical Assurance and Inspection of Electronics (PAINE) 2020
DOI: 10.1109/paine49178.2020.9337728
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SPARTA-COTS: A Laser Probing Approach for Sequential Trojan Detection in COTS Integrated Circuits

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Cited by 13 publications
(5 citation statements)
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“…The test-based and run-time defenses discussed in Section 5.3 are post-silicon HT detection methods. Other post-silicon HT detection methods include: (a) destructive reverse-engineering, which involves de-packaging and delayering the chip, imaging the chip's layers, and using software to stitch together the prepared images, thereby recovering the layout and netlist, which thereafter can be carefully examined to detect the presence of HTs [66], [67]; (b) non-destructive side-channel analysis to expose the HT location, for example using optical circuit analysis [68], electromagnetic emanation (EM) measurements [69], [70], [71], thermal map analysis [72], backscattering [73], and laser probing [74]; and (c) using on-chip monitors, i.e., current sensors [75], thermal sensors [76], and invariance checkers [77], for run-time HT detection.…”
Section: Related Prevention and Detection De-fense Mechanismsmentioning
confidence: 99%
“…The test-based and run-time defenses discussed in Section 5.3 are post-silicon HT detection methods. Other post-silicon HT detection methods include: (a) destructive reverse-engineering, which involves de-packaging and delayering the chip, imaging the chip's layers, and using software to stitch together the prepared images, thereby recovering the layout and netlist, which thereafter can be carefully examined to detect the presence of HTs [66], [67]; (b) non-destructive side-channel analysis to expose the HT location, for example using optical circuit analysis [68], electromagnetic emanation (EM) measurements [69], [70], [71], thermal map analysis [72], backscattering [73], and laser probing [74]; and (c) using on-chip monitors, i.e., current sensors [75], thermal sensors [76], and invariance checkers [77], for run-time HT detection.…”
Section: Related Prevention and Detection De-fense Mechanismsmentioning
confidence: 99%
“…This concept is represented in Figure 4, where the state elements (i.e., DFFs) of a design are stitched together to form a scan-chain, while the Trojan FFs are excluded from the same. Stern et al exploited this notion to detect Trojans using a non-destructive backside laser probing approach [48]. This approach relies on finding the location of sequential elements (FFs) for a hardware Trojan.…”
Section: B Sequential Trojan Detectionmentioning
confidence: 99%
“…Upon comparing the two sets of EOFM images, the locations of the malicious FFs are determined. Figure 5 shows the processed EOFM images from the experimentation conducted in [48] on Trust-hub benchmark circuits. The red boxes in Figure 5.…”
Section: B Sequential Trojan Detectionmentioning
confidence: 99%
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“…HT designs are becoming increasingly sophisticated [2]- [4] making the development of countermeasures very challenging. Countermeasures include pre-silicon prevention of HT insertion (i.e., based on functional filler cells [5], logic obfuscation [6], camouflaging [7], or split manufacturing [8]), detection of the presence of HTs prior to IC usage (i.e., based on logic testing tools [9], Information Flow Tracking (IFT) [10], and sidechannel analysis [11], [12]), and detection of HT activation during run-time (i.e., based on on-chip monitors [13]).…”
Section: Introductionmentioning
confidence: 99%