Soviet Progress in the Design of Fault-Tolerant Digital Machines

On generalizing the D-algorithm

“…It will turn out that this problem alone is difficult enough for an entire report. The first attempt at such an algorithm, based on results by R. D. Eldrid [10] and [16], [26], Some specific extensions of Roth's work include: structural factors in fault diagnosis [1], [2], [23], multiple fault diagnosis [3], [5], [7], [9], sequential circuit testing [21], fault location and coverage [6], [14], [31], and more general circuit and fault models [4], [10], [17], Recent work has tended to be in the areas of design for reliability and testability [1], [8], [12], [13], [30], and tests for specific types of circuits [11], [12], [18] "If the fault is present, then the first input will be 1 and the second input will be 0, so that the output is 1. If the fault is not present, then the first input will be 0 and the second input will be 0 so the output will be 0.…”