Some Observations on the Interference Fringes Formed by X Rays Scattered from Thin Films

Sauro, J.; Bindell, J. B.; Wainfan, N.

doi:10.1103/physrev.143.439

Cited by 20 publications

(9 citation statements)

References 11 publications

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“…The correlation is even better if roughness is included at surface and interfaces. The continuous line represents the simulated reflectivity curve with the thickness and density mentioned above 45 and a surface/interface roughness RMS of 1 nm ͑within the framework of the Croce-Névot model 46 ͒.…”

Section: Resultsmentioning

confidence: 99%

Morphological evolution of the fivefold surface ofi−AlPdMnquasicrystals

et al. 2002

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Morphology of the fivefold symmetric quasicrystal surface of AlPdMn was investigated by x-ray reflectivity and by x-ray diffraction. X-ray experiments revealed two different morphologies depending on the surface preparation. Sputtering and annealing up to 900 K, under UHV conditions, produced a rough and facetted quasicrystal surface. These features were confirmed by atomic force microscopy and scanning tunnel microscopy measurements. We also observed that an annealing above 900 K induces a rapid and irreversible transition toward a flat surface.

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Section: Resultsmentioning

confidence: 99%

Morphological evolution of the fivefold surface ofi−AlPdMnquasicrystals

et al. 2002

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“…The true density can be determined by the critical angle, and the thickness was analyzed in the fringe pattern obtained with GXRR software based on Parratt's method. 16,19 Since the surface roughness of amorphous carbon films is less than 1.0 nm as shown in the insets of Figs. 1(b) and 1(d), the effect of it on the other measurements (e.g., SE) is negligible.…”

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confidence: 99%

Structural analysis of amorphous carbon films by spectroscopic ellipsometry, RBS/ERDA, and NEXAFS

Zhou

Suzuki

Nakajima

et al. 2017

Applied Physics Letters

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The structural analysis of amorphous carbon films is not only the premise of their unique properties applied in the industrial fields but also the indispensable element on their classification. In this letter, we refurbished the classification of amorphous carbon films based on the optical constants in terms of the refractive index (n) and the extinction coefficient (k). In the selected photon energy range, we defined the maximum of n (En-max) and k at a value more than 10−4 (Ek) to explore the relationship between different classification schemes for amorphous carbon films deposited by different techniques. We found that Ek and En-max of the deposited amorphous carbon films have an exponential relationship with the hydrogen contents. Thus, the spectroscopic ellipsometry analysis can also be used as one of the effective methods for the structural evaluation of the amorphous carbon films.

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“…Nonetheless, the true density obtained from XRR method is generally determined by the critical angle, whose simulated value 0.358° is in good agreement with the experimental value 0.360°. The true density can be determined by the critical angle, and the thickness analyses by the fringe pattern which are obtained with GXRR software based on the Parrat's method [28]. Therefore, the discrepancy mentioned above in the large-angle region has no effect on the determination of the GC density.…”

Section: Resultsmentioning

confidence: 99%

Spectroscopic Ellipsometry - Application on the Classification of Diamond-Like Carbon Films

Zhou¹,

Saitoh²

2017

Ellipsometry - Principles and Techniques for Materials Characterization

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Diamond-like carbon (DLC) films have been spreading from their theoretical basis to worldwide industrial applications because of their unique properties. Since their properties depend strongly on the conditions of synthesis, the effective classification of DLC films becomes quite necessary. From the ternary phase diagram to the Japan New Diamond Forum standard, the classification attempts are also accompanied by the continuous development of their applications. Generally, the hydrogen content and sp hybrid carbons in the hydrogen-terminated cluster. Simultaneously, the above classification methods need to use the large equipment, such as the synchronous radiation source. Therefore, to realize more straightforward to classify DLC films efficiently, the optical constants (refractive index (n) and extinction coefficient (k)) have been proposed in 2013 to be effective method to classify the DLC films, for which a lot of considerable discussion in the past ISO/TC-107 meetings has been made. The purpose of this chapter is to introduce the latest developments of optical constants on the classification of DLC films and explore their relationship with the current standard.

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Some Observations on the Interference Fringes Formed by X Rays Scattered from Thin Films

Cited by 20 publications

References 11 publications

Morphological evolution of the fivefold surface ofi−AlPdMnquasicrystals

Morphological evolution of the fivefold surface ofi−AlPdMnquasicrystals

Structural analysis of amorphous carbon films by spectroscopic ellipsometry, RBS/ERDA, and NEXAFS

Spectroscopic Ellipsometry - Application on the Classification of Diamond-Like Carbon Films

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