Some aspects of the charging effect in monochromatized focused XPS

Xiangrong, Yu; Hantsche, Harald

doi:10.1007/bf00321421

Cited by 23 publications

(16 citation statements)

References 5 publications

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“…While the spectra are complicated by differential charging effects which result in a doubling of some of the peaks, the only two peaks observed are associated with SiO 2 and Li x Si. 28,35 As expected the peak associated with the Li x Si becomes dominant at the greatest depth of penetration. After 5 cycles differences are observed for the FEC electrolyte, especially at the greater depths of penetration.…”

Section: Electrochemical Cyclingmentioning

confidence: 69%

Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries

Young

Heskett²,

Nguyen³

et al. 2015

ACS Appl. Mater. Interfaces

129

131

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Binder-free silicon (BF-Si) nanoparticle anodes were cycled with 1.2 M LiPF6 in ethylene carbonate (EC), fluoroethylene carbonate (FEC), or EC with 15% FEC (EC:FEC), extracted from cells and analyzed by Hard X-ray Photoelectron Spectroscopy (HAXPES). All of the electrolytes generate an SEI which is integrated with Si containing species. The EC and EC:FEC electrolytes result in the generation of LixSiOy after the first cycle while LixSiOy is only observed after five cycles for the FEC electrolyte. The SEI initially generated from the EC electrolyte is primarily composed of lithium ethylene dicarbonate (LEDC) and LiF. However, after five cycles, the composition changes, especially near the surface of silicon because of decomposition of the LEDC. The SEI generated from the EC:FEC electrolytes contains LEDC, LiF, and poly(FEC) and small changes are observed upon additional cycling. The SEI generated with the FEC electrolyte contains LiF and poly(FEC) and small changes are observed upon additional cycling. The stability of the SEI correlates with the observed capacity retention of the cells.

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Section: Electrochemical Cyclingmentioning

confidence: 69%

Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries

Young

Heskett²,

Nguyen³

et al. 2015

ACS Appl. Mater. Interfaces

129

131

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show abstract

“…As described, most methods use charged particles (ions, electrons) as a probe (primary beam), but also the secondary beam can consist of charged species. Both can induce charging effects on non-conductive materials, which often leads to errors in the measured data and to misinterpretations, especially in electron spectroscopy [12].…”

Section: Problem-oriented Use Of Microanalytical Techniques For Defecmentioning

confidence: 99%

Characterization of Defects in Glasses and Coatings on Glasses by Microanalytical Techniques

2000

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The most relevant defects in glasses and thin ®lms on glasses are categorized and investigated by the appropriate microanalytical techniques. Knots, which are local glassy inclusions, are described in greater detail. The combination of EPMA/EDX and LA-ICP-MS allow the determination of element concentrations in the defect down into the low ppm range, thus ®nally enabling the identi®cation of a special source of the defect from otherwise non distinguishable refractories. The results of analysis of stones and striae are reported and defect sources are discussed. Local defects in thin ®lms are characterized which can be explained by high intrinsic compressive stress in the ®lms. Typical glass and thin ®lm defects are used to illustrate the problem-solving process in industrial labs.

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“…The relationship between Eb and P is expressed as Eq. (6). By using this equation one can estimate the binding energy (Eb) where charge-up doesn't occur.…”

Section: Determination C F the Spectrometer Work Functionmentioning

confidence: 99%

“…Now, E° represents the binding energy where the X-ray power is equal to zero, i.e., the magnitude of the chargeup is equal to zero. If U is identical to the charge-up potential, the apparent binding energy (Eb) is written by Eb=Eb+U = Eb + aP/(bP + c) (6) as a possible form to describe the variation of the apparent binding energy with the X-ray power. If this expression is in fact applicable, one could possibly use it to extrapolate to P=0 to obtain the value of Ee, which is the charge-free measured binding energy for insulating samples.…”

mentioning

confidence: 99%

Charge-up Phenomena of Insulated Metals in X-Ray Photoelectron Spectroscopy

1996

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The X-ray power dependence of the charge-up shift of a photoelectron line was examined for metal films insulated from a spectrometer. As the X-ray power increased, the observed line position shifted to a higher binding energy, and approached an asymptotic value. This charge-up behavior was treated based on the balance between the photoelectron emission from the sample surface and electron injection from an aluminum window of the X-ray source and from other electron sources. It was concluded that, for insulated metals, the vacuum level of the sample is aligned to that of the spectrometer when the X-ray power is extrapolated to zero, i.e., the magnitude of the charge-up is equal to zero. The work function of the spectrometer was successfully determined with samples having a known work function. A new method to obtain the binding energy relative to the vacuum level for insulators is proposed.

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Some aspects of the charging effect in monochromatized focused XPS

Cited by 23 publications

References 5 publications

Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries

Hard X-ray Photoelectron Spectroscopy (HAXPES) Investigation of the Silicon Solid Electrolyte Interphase (SEI) in Lithium-Ion Batteries

Characterization of Defects in Glasses and Coatings on Glasses by Microanalytical Techniques

Charge-up Phenomena of Insulated Metals in X-Ray Photoelectron Spectroscopy

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