2004
DOI: 10.1016/j.eurpolymj.2004.01.021
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Some aspects of AFM nanomechanical probing of surface polymer films

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Cited by 72 publications
(73 citation statements)
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“…[276,277]. Also the effect on the sample deformation of maximum load [278], contact time [279], and loading rate [280] have been characterized.…”
Section: Resultsmentioning
confidence: 99%
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“…[276,277]. Also the effect on the sample deformation of maximum load [278], contact time [279], and loading rate [280] have been characterized.…”
Section: Resultsmentioning
confidence: 99%
“…For thin deformable films the effect of the substrate cannot be neglected [264,280,283]. When working with thick samples, indentations are limited to depths much smaller than the total thickness of the sample (10-20%), in order to eliminate the influence of the substrate.…”
Section: Resultsmentioning
confidence: 99%
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“…The results demonstrated that the overall response of an isolated nucleus in micropipette aspiration experiment is highly sensitive to the stiffness of the nuclear envelope, while the mechanical contribution of the nucleoplasm over the time course of these experiments is insignificant. Here, we used this computational model to examine the deformation of an isolated nucleus in indentation experiments using atomic force microscopy (AFM), which have been used extensively for imaging and studying the mechanical behavior and rheology of polymers, [13][14][15][16] thin films, [17][18][19][20] and biological materials. [21][22][23][24] It is noteworthy that the current data on the apparent stiffness of cell nuclei are rather divergent, with values ranging from 18 Pa to nearly 10 kPa 12,[25][26][27] due to factors such as cell type, measurement techniques and conditions, length scale of interest, and also interpretation methods.…”
Section: Introductionmentioning
confidence: 99%
“…Suitable for laboratory studies Benvenuti et al 1999, Minabe et al 2000, Fretwall and Douglas 2001, Tikka et al 2004, Braithwaite et al 2005, Kronberg et al 2007 Atomic Force Microscopy High resolution pictures. Unsuitable for rough surfaces Myshkin et al 1999, Verran et al 2000, Myshkin et al 2003, Verran et al 2003, Peltonen et al 2004, Shulha et al 2004, Whitehead et al 2004, Kuisma et al 2005a, Kuisma 2006, Koponen et al 2007a Confocal Microscopy Minimal sample preparation. Background texture often confuses the detectors.…”
Section: Other Methodsmentioning
confidence: 99%