Crystal growth in 1 μm Se(1–y)Te
y
thin films (for y = 0, 7, 10, and 17) deposited
on the Kapton, SiO2 glass,
and white glass substrates was researched and quantified by means
of a unique combination of direct joint microscopic and calorimetric
measurements. As a general feature, the crystal growth in the Se–Te
thin films deposited on a Kapton tape was very close to the native/bulk
crystal growth. Deposition on the inorganic glassy substrates largely
accelerated the crystal growth in the Se–Te thin films due
to the build-up of internal tension originating from the large difference
in thermal expansion coefficients between the film and the substrate.
An additional increase in the crystal growth rate was also caused
by the diffusion of Na+ ions from the white glass substrate
into the Se–Te films. Almost perfect correspondence was found
for the activation energies of crystal growth determined by various
measurement techniques (calorimetry and microscopy) and for various
Se–Te sample forms (thin films, bulk glass, powdered bulk glass).
A very good agreement was found also between the activation energies
of viscous flow and structural relaxation at the glass transition
temperature T
g. At higher temperatures,
the Se–Te thin films exhibit a minor-to-moderate breach of
the Stokes–Einstein law, as expressed by the value of Ediger’s
decoupling parameter ξ ≈ 0.80 ± 0.05. At lower temperatures
near the glass transition, the violation of the Stokes–Einstein
relation deepens for the thin films with higher Te content. An explanation
was proposed based on the potential interconnection between the below-T
g relaxation kinetics and above-T
g connectivity of the undercooled liquid domains (resulting
either in changes of the effective hydrodynamic radius during the
self-diffusion or in the tendency to create structural inhomogeneities
via thermal fluctuations).