Handbook of the Eurolaser Academy 1998
DOI: 10.1007/978-1-4615-5295-6_4
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Solid state lasers

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“…Due to lattice mismatch of 4% between Si and Ge, relatively thick layers are relaxed into defects through the creation of misfit dislocations and resulting threading dislocations running to the surface. The misfit dislocation structure present in compound semiconductors and their association with photoluminescence emission were reported earlier [3]. These emissions were observed as D-band dislocation luminescence and have been associated with interstitial-type defects as supported also by DLTS measurements [4].…”
Section: Introductionsupporting
confidence: 64%
“…Due to lattice mismatch of 4% between Si and Ge, relatively thick layers are relaxed into defects through the creation of misfit dislocations and resulting threading dislocations running to the surface. The misfit dislocation structure present in compound semiconductors and their association with photoluminescence emission were reported earlier [3]. These emissions were observed as D-band dislocation luminescence and have been associated with interstitial-type defects as supported also by DLTS measurements [4].…”
Section: Introductionsupporting
confidence: 64%