Soft X-ray Optimization Studies on a Dense Plasma Focus Device Operated in Neon and Argon in Repetitive Mode

Wong, D.; Patran, A.; Tan, T.L.; Rawat, Rajdeep Singh; Lee, Paul

doi:10.1109/tps.2004.838596

Cited by 87 publications

(22 citation statements)

References 20 publications

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“…The experiments were carried out on the NX2: a 27.6-μF, 15-kV, 430-kA DPF device. The details of the device, together with the SXR optimization studies are described elsewhere [2,3]. The total SXR yield was measured using filtered BPX65 PIN diodes placed 410 mm radially from the anode axis.…”

Section: Methodsmentioning

confidence: 99%

Repetitive Operation of A Dense Plasma Soft X-ray Source for Micromachining

Wong¹,

Tan²,

Patran³

et al. 2006

AIP Conference Proceedings

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The NX2 device, a low energy plasma focus, at the Nanyang Technological University in Singapore, was used as a soft X-ray (SXR) source for micromachining. The gas used was neon which produced SXRs in a narrow spectral range of 0.9-1.6 keV. The SXR yield from repetitive operation of the NX2 device was monitored and measured using a cost effective multi-channel SXR spectrometric system. The system consists of filtered BPX65 PIN diodes, with the associated electronics-an integrator, sample and peak holder, analogue switch, an A/D converter and a microcontroller. The system enables easy shot-to-shot statistical analysis under repetitive operation at adjustable preset trigger frequencies. A total of 4000 shots were fired at 0.5 Hz, using the same gas filling. The SXR production was at an average yield of 60 J/shot and a maximum single-shot yield of more than 100 J. The SXRs emitted by the NX2 device was used for contact micromachining, producing structures with an excellent aspect ratio of up to 20:1 on 25 μm SU-8 resist.

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Section: Methodsmentioning

confidence: 99%

Repetitive Operation of A Dense Plasma Soft X-ray Source for Micromachining

Wong¹,

Tan²,

Patran³

et al. 2006

AIP Conference Proceedings

Self Cite

View full text Add to dashboard Cite

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“…[1][2][3][4][5] One of the most interesting features of these machines is that they are cost-effective, versatile, and technically simple for construction comparing with the devices such as Z-pinch or Tokamak, especially in the field of nuclear fusion research and x-ray study. Since 5% and 10% of the stored capacitor energy are found to be converted into 1 keV x-rays for low and high energy DPF devices, respectively, 6,7 an important part of the experimental research on x-ray emission from DPF devices has been oriented to the interesting applications such as contact microscopy, x-ray lithography, x-ray backlighting, radiography, and micromachining. [8][9][10][11][12][13] The pinch phenomenon in plasma focus devices has significant role in hard x-rays production.…”

Section: Introductionmentioning

confidence: 99%

The study of pinch regimes based on radiation-enhanced compression and anomalous resistivity phenomena and their effects on hard x-ray emission in a Mather type dense plasma focus device (SABALAN2)

et al. 2015

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In this study, by using argon and nitrogen as the filling gases in a Mather type dense plasma focus device at different values of pressure and charging voltage, two different kinds of pinch regimes were observed for each of the gases. The physics of the pinch regimes could be explained by using the two versions of the Lee's computational model which predicted each of the scenarios and clarified their differences between the two gases according to the radiation-enhanced compression and, additionally, predicted the pinch regimes through the anomalous resistivity effect during the pinch time. This was accomplished through the fitting process (simulation) on the current signal. Moreover, the characteristic amplitude and time scales of the anomalous resistances were obtained. The correlations between the features of the plasma current dip and the emitted hard x-ray pulses were observed. The starting time, intensity, duration, and the multiple or single feature of the emitted hard x-ray strongly correlated to the same respective features of the current dip.

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“…An important part of experimental studies on X-ray and particle emission from dense plasma focus (DPF) is oriented to interesting applications such as contact microscopy, X-ray and electron beam lithography, Xray radiography, and micromachining (Kato and Be 1986;Beg et al 2000;Gribkov et al 2002;Wong et al 2004). It has been widely reported that the production of neutrons, X-rays, and charge particle beams from the DPF is solely related to the dynamics of the collapsing current sheath at the top of the electrode assembly of the device (Decker et al 1983;Kwek et al 1990).…”

Section: Introductionmentioning

confidence: 99%

The effect of helium impurity addition on current sheath speed in argon-operated plasma focus using a tridimensional magnetic probe

et al. 2013

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Using the tridimensional magnetic probe, the current sheath velocity at 0.25 Torr is studied in Sahand, a Filippov-type plasma focus facility. The current sheath velocity in argon-filled plasma focus with different percentages of helium impurity at different operating voltages was studied. The highest average current sheath velocity of 12.26 ± 1.51 cm μs −1 at the top of the anode in the axial phase was achieved at 17 kV. Minimum average current sheath velocity is 5.24 ± 1.18 cm μs −1 at 12 kV with 80% argon + 20% helium as a working gas. The full width at half-maximum of peaks of the magnetic probe was found to be inversely related to the current sheath velocity, i.e. smaller at higher voltages for different impurity and decreased with increasing of impurity.

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Soft X-ray Optimization Studies on a Dense Plasma Focus Device Operated in Neon and Argon in Repetitive Mode

Cited by 87 publications

References 20 publications

Repetitive Operation of A Dense Plasma Soft X-ray Source for Micromachining

Repetitive Operation of A Dense Plasma Soft X-ray Source for Micromachining

The study of pinch regimes based on radiation-enhanced compression and anomalous resistivity phenomena and their effects on hard x-ray emission in a Mather type dense plasma focus device (SABALAN2)

The effect of helium impurity addition on current sheath speed in argon-operated plasma focus using a tridimensional magnetic probe

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