Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources

Malagón, Daniel; Bota, S.; Torrens, Gabriel; Gili, Xavier; Praena, J.; Fernández, B.; Macías, M.; Quesada, J. M.; Guerrero, C.; Jiménez-Ramos, M.C.; López, J. Garcı́a; Merino, J.L.; Segura, J.

doi:10.1016/j.microrel.2017.07.093

Cited by 18 publications

(7 citation statements)

References 27 publications

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“…HISPANoS, from Hispalis Neutron Source ( ), is the first accelerator-based neutron source (pulsed and continuous wave) in Spain located at the 3 MV tandem accelerator at the National Accelerator Centre (CNA, Seville) [ 9 , 10 ]. At HISPANoS, fast, epithermal, and thermal neutrons can be delivered through different nuclear reactions [ 2 , 11 , 12 ]. In the case of the epithermal beams of interest in this work, the proton beam and beam-shaping assembly (BSA) configurations from Fantidis et al [ 13 ] have been considered: a proton beam of 2.5 MeV, in our case, with a current of 10 µA would hit a water-cooled thick lithium target, producing, in the absence of the BSA, ~3·10 7 n/cm 2 /s at 10 cm.…”

Section: Methodsmentioning

confidence: 99%

Quantification of Boron Compound Concentration for BNCT Using Positron Emission Tomography

Balcerzyk

Miguel

Guerrero

et al. 2020

Cells

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Background: Boron neutron capture therapy requires a 2 mM 10B concentration in the tumor. The well-known BNCT patient treatment method using boronophenylalanine (BPA) as a boron-carrying agent utilizes [18F]fluoroBPA ([18F]FBPA) as an agent to qualify for treatment. Precisely, [18F]FBPA must have at least a 3:1 tumor to background tissue ratio to qualify the patient for BNCT treatment. Normal, hyperplasia, and cancer thyroids capture iodine and several other large ions, including BF4−, through a sodium-iodine symporter (NIS) expressed on the cell surface in normal conditions. In cancer, NIS is also expressed within the thyroid cell and is not functional. Methods: To visualize the thyroids and NIS, we have used a [18F]NaBF4 positron emission tomography (PET) tracer. It was injected into the tail veins of rats. The [18F]NaBF4 PET tracer was produced from NaBF4 by the isotopic exchange of natural 19F with radioactive 18F. Rats were subject to hyperplasia and tumor-inducing treatment. The NIS in thyroids was visualized by immunofluorescence staining. The boron concentration was calculated from Standard Uptake Values (SUV) in the PET/CT images and from the production data. Results: 41 MBq, 0.64 pmol of [18F]NaBF4 PET tracer that contained 0.351 mM, 53 nmol of NaBF4 was injected into the tail vein. After 17 min, the peak activity in the thyroid reached 2.3 MBq/mL (9 SUVmax). The natB concentration in the thyroid with hyperplasia reached 381 nM. Conclusions: Such an incorporation would require an additional 110 mg/kg dose of [10B]NaBF4 to reach the necessary 2 mM 10B concentration in the tumor. For future BNCT treatments of thyroid cancer, contrary to the 131I used now, there is no post-treatment radioactive decay, the patient can be immediately discharged from hospital, and there is no six-month moratorium for pregnancy. This method can be used for BNCT treatment compounds of the type R-BFn, where 1 <= n <= 3, labeled with 18F relatively easily, as in our example. A patient may undergo injection of a mixture of nonradioactive R-BFn to reach the necessary 10B concentration for BNCT treatment in the tumor together, with [18F]R-BFn for boron mapping.

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Section: Methodsmentioning

confidence: 99%

Quantification of Boron Compound Concentration for BNCT Using Positron Emission Tomography

Balcerzyk

Miguel

Guerrero

et al. 2020

Cells

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“…The occurrence of false 3-bit MCUs should lead to add a negligible correction to (8) and related, which will be deeply studied in (15) & Section IV-B. Besides, an additional parameter, M , has been added to (13) since, theoretically, the role of a i as central SBU can be also played by a j and by a k . Therefore, ideally, M = 3.…”

Section: B False 3-bit Multiple Eventsmentioning

confidence: 99%

“…As expected, the number of observed SBUs decreases with the Manhattan distance whilst the number of observed multiple events grows. In each subfigure, there are two additional lines showing the least and most pessimistic predictions issued from (15) with (8), and (13) and (14), in which M = 1 and S 2S were used for the optimistic prediction and M = 3 and S 2L for the pessimistic one. Despite the approximations done, experimental results seem to be in acceptable agreement with the predictions.…”

Section: Experimental Validationmentioning

confidence: 99%

“…In 2009, Tausch applied the "birthday statistics" model to deduce a simple formula providing the probability of misleading pairs of SBUs with 2-bit MCUs and backed up his deductions with results on apparent MBUs in an irradiated FPGA [8]. This model has been widely used since its publication in order to test the accuracy of experimental multiple-event cross sections [5], [9]- [13]. Recently, the authors related the birthday statistics with the expected number of false pairs of events according to the classical "Urn-and-balls" problem [14].…”

Section: Introductionmentioning

confidence: 99%

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Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

Franco

Clemente

Korkian

et al. 2020

IEEE Trans. Nucl. Sci.

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In radiation tests on SRAMs or FPGAs, two or more independent bitflips can be misled with a multiple event if they accidentally occur in neighbor cells. In the past, different tests such as the "birthday statistics" have been proposed to estimate the accuracy of the experimental results. In this paper, simple formulae are proposed to determine the expected number of false 2-bit and 3-bit MCUs from the number of bitflips, memory size and the method used to search multiple events. These expressions are validated using Monte Carlo simulations and experimental data. Also, a technique is proposed to refine experimental data and thus partially removing possible false events. Finally, it is demonstrated that there is a physical limit to determine the cross section of memories with arbitrary accuracy from a single experiment.

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“…Radiation-induced soft errors in nanometer-scale electronic circuits are of increasing concern in missioncritical space-based [1], high altitude [2], and terrestrial applications [3]. For instance, space missions which take place in a harsh environment in terms of cosmic radiation particles, temperature, and electromagnetic disturbances have grappled with radiation-induced upsets for many decades of continued device technology scaling [4].…”

Section: Introduction and Previous Workmentioning

confidence: 99%

Radiation-hardened MRAM-based LUT for non-volatile FPGA soft error mitigation with multi-node upset tolerance

Zand¹,

DeMara²

2017

J. Phys. D: Appl. Phys.

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In this paper, we have developed a radiation-hardened non-volatile lookup table (LUT) circuit utilizing spin Hall Effect (SHE)-magnetic random access memory (MRAM) devices. The design is motivated by modeling the effect of radiation particles striking hybrid CMOS/spin based circuits, and the resistive behavior of SHE-MRAM devices via established and precise physics equations. The models developed are leveraged in the SPICE circuit simulator to verify the functionality of the proposed design. The proposed hardening technique is based on using feedback transistors, as well as increasing the radiation capacity of the sensitive nodes. Simulation results show that our proposed LUT circuit can achieve multiple node upset (MNU) tolerance with more than 38% and 60% power-delay product improvement as well as 26% and 50% reduction in device count compared to the previous energy-efficient radiation-hardened LUT designs. Finally, we have performed a process variation analysis showing that the MNU immunity of our proposed circuit is realized at the cost of increased susceptibility to transistor and MRAM variations compared to an unprotected LUT design.

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Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources

Cited by 18 publications

References 27 publications

Quantification of Boron Compound Concentration for BNCT Using Positron Emission Tomography

Quantification of Boron Compound Concentration for BNCT Using Positron Emission Tomography

Inherent Uncertainty in the Determination of Multiple Event Cross Sections in Radiation Tests

Radiation-hardened MRAM-based LUT for non-volatile FPGA soft error mitigation with multi-node upset tolerance

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