2010
DOI: 10.1097/opx.0b013e3181e170c5
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Soft Contact Lens Surface Profile by Atomic Force Microscopy

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Cited by 52 publications
(41 citation statements)
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“…The Atomic Force Microscopy (AFM) is a technique that becomes useful to determine these properties, as was pointed out in an earlier work by Rabke et al [1]. Consequently, several authors [2][3][4][5][6][7][8][9][10][11][12][13][14][15] performed studies on CLs and using the AFM technique, but none of them used the Peak Force Quantitative Nanomechanics mode to determine the nanomechanical properties, such as the adhesion or the Young modulus, also named elastic modulus.…”
Section: Introductionmentioning
confidence: 99%
“…The Atomic Force Microscopy (AFM) is a technique that becomes useful to determine these properties, as was pointed out in an earlier work by Rabke et al [1]. Consequently, several authors [2][3][4][5][6][7][8][9][10][11][12][13][14][15] performed studies on CLs and using the AFM technique, but none of them used the Peak Force Quantitative Nanomechanics mode to determine the nanomechanical properties, such as the adhesion or the Young modulus, also named elastic modulus.…”
Section: Introductionmentioning
confidence: 99%
“…However, this is not the usual situation, as most of surfaces are not perfectly homogeneous in their irregularities distribution. In fact, there has been reported differences in CL surface roughness values at different magnifications using AFM technique, showing higher roughness scores in higher areas (Gonzalez-Meijome et al, 2006a;Giraldez et al, 2010c). Degree of variation of roughness parameters when increasing size of the measured area could be representative of how homogeneous a surface is.…”
Section: Surface Roughness By Wlopmentioning
confidence: 99%
“…In effect, AFM has proved useful for characterizing tear deposits on worn soft contact lens surfaces (Baguet et al, 1995;Rebeix et al, 2000) or characterizing the rigid gas permeable contact lens surface (Bruinsma et al, 2003). In fact, detailed information about the surface quality of CL has been studied previously by Atomic Force Microscopy (AFM) (Bhatia et al, 1997;Baguet et al, 1993;Baguet et al, 1995;Bruinsma et al, 2003;Gonzalez-Meijome et al, 2006a;Gonzalez-Meijome et al, 2009;Giraldez et al, 2010c) and Cryo-SEM (Gonzalez-Meijome et al, 2006b;Guryca et al, 2007). AFM is a very powerful tool for high resolution examination of hydrated CL surface structure.…”
Section: Atomic Force Microscopymentioning
confidence: 99%
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