2017
DOI: 10.1109/led.2017.2731799
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Slanted Tri-Gates for High-Voltage GaN Power Devices

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Cited by 59 publications
(50 citation statements)
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References 18 publications
(15 reference statements)
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“…In the hybrid tri-anode drain, two field plates, e.g. the planar and the tri-gate regions, are integrated with the tri-anode, by simply engineering their pinch-off voltages with the tri-gate approach, which spread effectively the electric field and improved the % B R [29,30]. We benchmarked our devices against state-of-the-art discrete GaN-on-silicon power MOSHEMTs and SBDs in Fig.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…In the hybrid tri-anode drain, two field plates, e.g. the planar and the tri-gate regions, are integrated with the tri-anode, by simply engineering their pinch-off voltages with the tri-gate approach, which spread effectively the electric field and improved the % B R [29,30]. We benchmarked our devices against state-of-the-art discrete GaN-on-silicon power MOSHEMTs and SBDs in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…The tri-gate region ( Fig. 1(d)) works as tri-gated FPs to shield the tri-anode region from high voltages, which along with the planar FP improves the % B R [14], [29], [30].…”
Section: Device Design and Fabricationmentioning
confidence: 99%
“…To date, the majority of the research has been directed towards lateral high electron mobility transistors (HEMTs) based on an AlGaN/GaN heterostructure [1]- [3]. This is due to the advantages offered by the high-density and high-mobility two-dimensional electron gas (2DEG) induced at the hetero-interface, which allow high-voltage devices with large switching speeds and reduced on-resistances.…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, GaN-on-Si technology has been developed extensively for several different areas, such as high-brightness light emitting diodes [21], high-power lateral HEMTs [2], [3], [22] and high-power vertical diodes [23]- [28]. However, there have been no reports up-to-date on GaN-on-Si vertical transistors, due to the challenge in obtaining high-quality n-p-n GaN heterostructures on silicon substrates.…”
Section: Introductionmentioning
confidence: 99%
“…The gate-to-source (L GS ) and gate-to-drain (L GD ) lengths were 1.5 lm. enhanced by reducing w,[23][24][25] leading to much improved V TH and SS [Fig. 3(b)].…”
mentioning
confidence: 99%