2008 20th International Symposium on Power Semiconductor Devices and IC's 2008
DOI: 10.1109/ispsd.2008.4538910
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SJ-FINFET: A New Low Voltage Lateral Superjunction MOSFET

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Cited by 19 publications
(16 citation statements)
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“…For the conventional SJ LDMOS, the p-type and n-type pillars are usually formed in the width direction, while the photo etching precision limits the junction depth and doping concentration of SJ pillars, which increases R on,sp . The SJ FINFET in [16] has the highest FOM but with low BV and complex process. However, the N-top layer and P-buried layer of JITR LDMOS are implemented in the longitudinal direction with simpler manufacturing process.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…For the conventional SJ LDMOS, the p-type and n-type pillars are usually formed in the width direction, while the photo etching precision limits the junction depth and doping concentration of SJ pillars, which increases R on,sp . The SJ FINFET in [16] has the highest FOM but with low BV and complex process. However, the N-top layer and P-buried layer of JITR LDMOS are implemented in the longitudinal direction with simpler manufacturing process.…”
Section: Resultsmentioning
confidence: 99%
“…Multiple RESURF LDMOS contains vertical structures which have multiple horizontal p-type pillars but without additional n-type pillars. For conventional SJ LDMOS [9]- [16], n-type pillars and p-type pillars are usually alternatively formed at the surface of drift region in the width direction. Further, the reported SJ LDMOS typically has high R on,sp and added masks.…”
Section: Introductionmentioning
confidence: 99%
“…This is as a result of the minimum pillar width in the SJ drift region which becomes similar to the built-in depletion region. On-resistance of the minimum pillar width cannot be further reduced and design variations of the SJ transistor are thus very limited [3,4].…”
Section: Introductionmentioning
confidence: 99%
“…This effect upsets the delicate charge balance between the N and P pillars of SJ, resulting in the decrease of the BV. Some new structures have been reported to eliminate the substrate-assisted depletion effect [2]- [6]. Aside from this, realizing high voltage on a thin buried oxide layer (BOX) in SOI has been a major issue, considering that the low vertical BV restricts the breakdown behavior of SOI devices.…”
Section: Introductionmentioning
confidence: 99%