2016
DOI: 10.1002/adfm.201604466
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Size‐Scalable and High‐Density Liquid‐Metal‐Based Soft Electronic Passive Components and Circuits Using Soft Lithography

Abstract: The use of conducting liquids with high electrical conductivity, such as eutectic gallium–indium (EGaIn), has great potential in electronics applications requiring stretchability and deformability beyond conventional flexible electronics relying on solid conductors. An advanced liquid metal thin‐line patterning process based on soft lithography and a compatible vertical integration technique are presented that enable size‐scalable and high‐density EGaIn‐based, soft microelectronic components and circuits. The … Show more

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Cited by 115 publications
(112 citation statements)
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“…The height variations of the printed features along their length are characterized using white-light interferometry (Zygo NewView 7300). Overall, the average EGaIn heights, which were greater than 1 µm, are larger than those seen by Gozen et al [49] and considerably larger than those seen in Kim et al [50,51] For the Si stamps, in general, a larger line width results in a smaller height. Since the oxide skin thickness does not exceed only a few nanometers (e.g., between ≈0.5-2.5 nm [8] ), the observed variations likely arise from the variations in EGaIn volume rather than changes in the oxide layer thickness.…”
Section: Characterization Of Test Pattern Geometriescontrasting
confidence: 51%
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“…The height variations of the printed features along their length are characterized using white-light interferometry (Zygo NewView 7300). Overall, the average EGaIn heights, which were greater than 1 µm, are larger than those seen by Gozen et al [49] and considerably larger than those seen in Kim et al [50,51] For the Si stamps, in general, a larger line width results in a smaller height. Since the oxide skin thickness does not exceed only a few nanometers (e.g., between ≈0.5-2.5 nm [8] ), the observed variations likely arise from the variations in EGaIn volume rather than changes in the oxide layer thickness.…”
Section: Characterization Of Test Pattern Geometriescontrasting
confidence: 51%
“…The unwanted residue formation was one of the limitations of other EGaIn fabrication approaches [49][50][51] and has been addressed in our approach. The unwanted residue formation was one of the limitations of other EGaIn fabrication approaches [49][50][51] and has been addressed in our approach.…”
Section: Characterization Of Test Pattern Geometriesmentioning
confidence: 99%
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“…Since the discovery of liquid metals (LM), metals in their liquid state at or near room temperature, have attracted increasing attention in the scientific community. Applications based on these liquid metals are ranging from soft electronics, environmentally responsive electronics, soft sensors,, pumps and actuators, (self)‐propulsion of LMs, energy harvesters,, heat transfer systems,, bioimaging, catalysisand media for running chemical reactions, e.g., for generation of atomically thin metal oxides dual‐trans printing, microchannels,, masked deposition, lithography,, dielectrophoresis, and handwriting .…”
Section: Introductionmentioning
confidence: 99%