Size-induced diffuse phase transition in the nanocrystalline ferroelectric<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">PbTiO</mml:mi></mml:mrow><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>

Chattopadhyay, Soma; Ayyub, Pushan; Palkar, V. R.; Multani, M.S.

doi:10.1103/physrevb.52.13177

Cited by 366 publications

(203 citation statements)

References 23 publications

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“…3. With decreasing film thickness, the mean polarization decreases, while the mean susceptibility increases, then goes up rapidly accompanying with a dielectric divergence, which is in agreement with the experimental data of KDP [34], BaTiO 3 [35] and PbTiO 3 fine particles [36,37]. For ferroelectric thin films, when the thickness is smaller than the critical value, the polarization cannot line up under thermoequilibrium because of the weakened long-range interaction by the sample size, but when a weak electric field is applied, they line up easily and show a large dielectric susceptibility.…”

Section: The Film Curie Temperaturet C Is Lower Than the Bulk Transitsupporting

confidence: 90%

Dielectric properties of ferroelectric thin films with surface transition layers

Chen

Lü

Cui

et al. 2008

Physica A: Statistical Mechanics and its Applications

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By taking into account surface transition layers (STL), the dielectric properties of ferroelectric thin films described by the transverse Ising model are discussed in the framework of the mean field approximation. Functions of the intra-layer and inter-layer couplings are introduced to characterize STL, which makes the model more realistic compared to previous treatment of surface layers using uniform surface exchange interactions and a transverse field. The effects of physical parameters on the dielectric properties are quantified. The results obtained indicate that STL has very strong influence on the dielectric properties of ferroelectric thin films. Some of our theoretical results are in accord with the available experimental data.

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Section: The Film Curie Temperaturet C Is Lower Than the Bulk Transitsupporting

confidence: 90%

Dielectric properties of ferroelectric thin films with surface transition layers

Chen

Lü

Cui

et al. 2008

Physica A: Statistical Mechanics and its Applications

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“…Finite-size effects are under consideration in a literature for a long time but only at the last decade the improved technology and deposition techniques provide a real possibility for obtaining of the films and particles with the controlled and reproduced parameters. It seems to be proved experimentally that the ferroelectric properties of the fine PbTiO 3 and BaTiO 3 nanometer powder disappear at the room temperature for the "critical size" of the particles that is about 10 nm for PbTiO 3 and 40 nm for BaTiO 3 [1][2][3][4][5].…”

Section: Introductionmentioning

confidence: 99%

Specific heat and heat conductivity of BaTiO₃polycrystalline films in the thickness range 20–1100 nm

Strukov

Davitadze

Kravchun

et al. 2003

J. Phys.: Condens. Matter

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Abstract. Thermal properties -specific heat and heat conductivity coefficient -of polycrystalline BaTiO 3 films on massive substrates were studied as a function of the temperature and the film thickness by ac-hot probe method. The anomalies of specific heat with decreasing of the film thickness from 1100 to 20 nm revealed the reducing of T c and excess entropy of the ferroelectric phase transition, which becomes diffused.The critical thickness of the film at which T c = 0 estimated as 2.5 nm.

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“…Unfortunately a thickness reduction from the macroscopic down to the mesoscopic regimes results in a change of polarization stability, although the polarization itself can be either inhibited or enhanced. [1][2][3][4][5][6] As the structural and polarization properties of these ultra thin films cannot readily be obtained by conventional techniques, there is a need for novel and reliable characterization techniques.…”

Section: Introductionmentioning

confidence: 99%

Domain orientation in ultrathin (Ba,Sr)TiO3 films measured by optical second harmonic generation

Мишина

Sherstyuk

Barskiy

et al. 2003

Journal of Applied Physics

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The analysis of polarization diagrams for specular and scattered second harmonic generation ͑SHG͒ was used for the structural characterization of submicron domain structures of thin (Ba,Sr͒TiO 3 ͑BST͒ films. It is shown that the lack of separation of these two contributions may lead to completely wrong conclusions about the domain orientation in these films. SHG studies of the thickness dependence of domain fractions ͑including 180°domains͒ reveal the presence of ferroelectric domains in ultrathin BST films ͑6 nm͒, although no domain structure was observed by atomic force microscopy. Thus the presence of ferroelectric ordering was demonstrated in perovskite films with a thickness down to 6 nm.

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Size-induced diffuse phase transition in the nanocrystalline ferroelectricPbTiO3

Cited by 366 publications

References 23 publications

Dielectric properties of ferroelectric thin films with surface transition layers

Dielectric properties of ferroelectric thin films with surface transition layers

Specific heat and heat conductivity of BaTiO₃polycrystalline films in the thickness range 20–1100 nm

Domain orientation in ultrathin (Ba,Sr)TiO3 films measured by optical second harmonic generation

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Size-induced diffuse phase transition in the nanocrystalline ferroelectricPbTiO3

Cited by 366 publications

References 23 publications

Dielectric properties of ferroelectric thin films with surface transition layers

Dielectric properties of ferroelectric thin films with surface transition layers

Specific heat and heat conductivity of BaTiO3polycrystalline films in the thickness range 20–1100 nm

Domain orientation in ultrathin (Ba,Sr)TiO3 films measured by optical second harmonic generation

Contact Info

Product

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Specific heat and heat conductivity of BaTiO₃polycrystalline films in the thickness range 20–1100 nm