Single shot fringe pattern phase demodulation using Hilbert-Huang transform aided by the principal component analysis

Trusiak, Maciej; Służewski, Łukasz; Patorski, Krzysztof

doi:10.1364/oe.24.004221

Cited by 64 publications

(24 citation statements)

References 77 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Huang et al [157] developed a new algorithm for analyzing nonlinear and non-stationary data, designated as the Hilbert-Huang transform (HHT). Trusiak et al [158,159] employed HHT to achieve efficient adaptive filtering and accurate phase demodulation by using local fringe direction estimation. As shown in Fig.…”

Section: Noise Resistancementioning

confidence: 99%

Development of surface reconstruction algorithms for optical interferometric measurement

2020

Front. Mech. Eng.

View full text Add to dashboard Cite

Optical interferometry is a powerful tool for measuring and characterizing areal surface topography in precision manufacturing. A variety of instruments based on optical interferometry have been developed to meet the measurement needs in various applications, but the existing techniques are simply not enough to meet the ever-increasing requirements in terms of accuracy, speed, robustness, and dynamic range, especially in on-line or on-machine conditions. This paper provides an in-depth perspective of surface topography reconstruction for optical interferometric measurements. Principles, configurations, and applications of typical optical interferometers with different capabilities and limitations are presented. Theoretical background and recent advances of fringe analysis algorithms, including coherence peak sensing and phase-shifting algorithm, are summarized. The new developments in measurement accuracy and repeatability, noise resistance, self-calibration ability, and computational efficiency are discussed. This paper also presents the new challenges that optical interferometry techniques are facing in surface topography measurement. To address these challenges, advanced techniques in image stitching, on-machine measurement, intelligent sampling, parallel computing, and deep learning are explored to improve the functional performance of optical interferometry in future manufacturing metrology.

show abstract

Section: Noise Resistancementioning

confidence: 99%

Development of surface reconstruction algorithms for optical interferometric measurement

2020

Front. Mech. Eng.

View full text Add to dashboard Cite

show abstract

“…where β is the local fringe orientation map, [43][44][45] SPF denotes spiral phase function, F and F −1 denote forward and inverse FT, respectively. The analytic π-hologram grants easy access to the phase map of interest E Q -T A R G E T ; t e m p : i n t r a l i n k -; e 0 0 7 ; 3 2 6 ; 4 2 2…”

Section: Algorithm Implementationmentioning

confidence: 99%

Single-shot two-frame π-shifted spatially multiplexed interference phase microscopy

et al. 2019

Self Cite

View full text Add to dashboard Cite

Single-shot, two-frame, π-shifted spatially multiplexed interference microscopy (π-SMIM) is presented as an improvement to previous SMIM implementations, introducing a versatile, robust, fast, and accurate method for cumbersome, noisy, and low-contrast phase object analysis. The proposed π-SMIM equips a commercially available nonholographic microscope with a high-speed (video frame rate) enhanced quantitative phase imaging (QPI) capability by properly placing a beam-splitter in the microscope embodiment to simultaneously (in a single shot) record two holograms mutually phase shifted by π radians at the expense of reducing the field of view. Upon subsequent subtractive superimposition of holograms, a π-hologram is generated with reduced background and improved modulation of interference fringes. These features determine superior phase retrieval quality, obtained by employing the Hilbert spiral transform on the π-hologram, as compared with a single low-quality (low signal-to-noise ratio) hologram analysis. In addition, π-SMIM enables accurate in-vivo analysis of high dynamic range phase objects, otherwise measurable only in static regime using time-consuming phase-shifting. The technique has been validated utilizing a 20 × ∕0.46 NA objective in a regular Olympus BX-60 upright microscope for QPI of different lines of prostate cancer cells and flowing microbeads.

show abstract

“…The modulation frequency, f , and modualtion function phase, θ, are user controlled parameters. Via the Convolution Theorem, the coherence function of the complete SCI spectrum, g complete , is given by (5), where G nom is the Fourier transform of g nom and M (ν; f, θ) is the Fourier transform of the modulation function, m(ν; f, θ). The final coherence function is normalized to achieve nominal fringe contrast of unity at OP D = 0.…”

Section: Theorymentioning

confidence: 99%

Spectrally controlled source for interferometric measurements of multiple surface cavities

Salsbury

Posthumus

Olszak

2018

Fifth European Seminar on Precision Optics Manufacturing

View full text Add to dashboard Cite

We present a new light source capable of locating interference fringes at an adjustable distance from the interferometer. The spectrum is electronically controlled in such a way that the fringes are limited to only one of the surfaces of the optics under test. With the new source it is straightforward, for example, to measure the parallel surfaces of thin glass plates and multiple surface cavities. Existing interferometers, as well as older systems, can be upgraded with this source.

show abstract

Single shot fringe pattern phase demodulation using Hilbert-Huang transform aided by the principal component analysis

Cited by 64 publications

References 77 publications

Development of surface reconstruction algorithms for optical interferometric measurement

Development of surface reconstruction algorithms for optical interferometric measurement

Single-shot two-frame π-shifted spatially multiplexed interference phase microscopy

Spectrally controlled source for interferometric measurements of multiple surface cavities

Contact Info

Product

Resources

About