Single Nanotube Raman Spectroscopy

Dresselhaus, M. S.; Dresselhaus, G.; Jório, Ado; Filho, A. G. Souza; Pimenta, M. A.; Saito, Riichiro

doi:10.1002/chin.200308229

Cited by 194 publications

(47 citation statements)

References 2 publications

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“…(iG /iD), which is often used for the evaluation of the defect density in graphite. 50 Clearly, the value of iG /iD decreases in the blistered region. It should be noted that blisters were found only inside the contact area of the droplet at the surface of the HOPG substrate in Figures 13 2b, indicating that they were generated by the electrochemical process.…”

Section: Characterization Of Surface Blisters On Hopg Using Afm and Rmentioning

confidence: 95%

Nanoscale Electrocatalysis of Hydrazine Electro-Oxidation at Blistered Graphite Electrodes

Kim

Perry

et al. 2016

ACS Appl. Mater. Interfaces

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Section: Characterization Of Surface Blisters On Hopg Using Afm and Rmentioning

confidence: 95%

Nanoscale Electrocatalysis of Hydrazine Electro-Oxidation at Blistered Graphite Electrodes

Kim

Perry

et al. 2016

ACS Appl. Mater. Interfaces

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“…It can also be used for individual nanotubes owing to its high sensitivity and chiral-selective resonance with laser irradiation wavelength [37][38][39]. Raman spectroscopy not only discriminates between m-and sc-tubes, it also enables the assignment of specific chiralities to individual tubes [40][41][42].…”

mentioning

confidence: 99%

“…We counted one metallic tube if the spectrum had a strong signal (the signal was visually well above the noise floor for a signal-to-noise ratio of approximately 3:1) and a broad G -peak at 1,530-1,560 cm -1 . Variations in intensity from pixel to pixel can be related to tube chirality, length, and its overlap with the laser spot [30][31][32][33][34][35][36][37]. For strong G -signals that extended over several contiguous pixels, the spectra were analyzed to determine whether each spot contained one or more m-tubes.…”

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confidence: 99%

Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin-film transistors

Ding

Finnie

et al. 2015

Nano Res.

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With recent improvements in carbon nanotube separation methods, the accurate determination of residual metallic carbon nanotubes in a purified nanotube sample is important, particularly for those interested in using semiconducting single-walled carbon nanotubes (SWCNTs) in electronic device applications such as thin-film transistors (TFTs). This work demonstrates that Raman microscopy mapping is a powerful characterization tool for quantifying residual metallic carbon nanotubes present in highly enriched semiconducting nanotube networks. Raman mapping correlates well with absorption spectroscopy, yet it provides greater differentiation in purity. Electrical data from TFTs with channel lengths of 2.5 and 5 μm demonstrate the utility of the method. By comparing samples with nominal purities of 99.0% and 99.8%, a clear differentiation can be made when evaluating the current on/off ratio as a function of channel length, and thus the Raman mapping method provides a means to guide device fabrication by correlating SWCNT network density and purity with TFT channel scaling.As-prepared single-walled corbon nanotube (SWCNT) raw materials contain bundles of nanotubes with a 2:1 semiconducting (sc-) to metallic (m-) ratio and other impurities such as catalysts and amorphous carbon [1][2][3]. For electrical devices, these raw materials must be debundled, purified, and enriched [4][5][6][7][8][9][10][11]. It has been demonstrated that for network thin-film transistors (TFTs), the m-tube content should be less than 2% [3]. For more demanding applications, such as high-frequency logic circuits and display backplanes, the m-tube content should be less than a few ppm given the need for high mobility and high current on/off ratios [12]. In recent years, multiple efforts have led to significant progress in solution-based enrichment techniques, with sc-SWCNT purities in excess of 99% routinely achieved. This leap, however, has now started to reveal the limits of common characterization methods, and other tools are required to provide accurate purity assessment [13,14].Typically, the purity of enriched sc-SWCNTs is Nano Research 2 Nano Res. estimated from the UV absorption spectrum by comparing the peak areas associated with the m-or sc-species [12,[15][16][17]. This method works well for samples whose peaks are well defined and for which background absorption is not dominant. However, as the sc-species purity increases, the features associated with m-tube absorption will gradually disappear and the precise subtraction of the background absorption will dramatically influence the calculated results and introduce uncertainty [18]. As an alternative, we have previously used a different purity metric, denoted as φ, which is based on the ratio of the sc-peak area over the total absorption background from the metallic (M 11 ) and semiconducting (S 22 ) absorption bands [16].Although we presume that φ correlates well with purity for highly pure samples, it does not provide a quantitative assessment. Furthermore, a solution sample is not nece...

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“…It is noted that Raman scattering is a resonant process. That is, when using a fixed laser wavelength, only a small portion of SWNTs with certain bandgaps can be detected by Raman spectroscopy [35]. In addition, the Raman frequencies of SWNTs are sensitive to environments, challenging the precise assignment of the chiral indices of SWNTs.…”

Section: Synthesis and Characterizations Of Swnts Grown On Fe-ti-o Camentioning

confidence: 99%

Fe Ti O based catalyst for large-chiral-angle single-walled carbon nanotube growth

Zhang

Jiang

et al. 2016

Carbon

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O based catalyst for large-chiral-angle single-walled carbon nanotube growth, Carbon (2016), Abstract:Catalyst selection is very crucial for controlled growth of single-walled carbon nanotubes (SWNTs).Here we introduce a well-designed Fe-Ti-O solid solution for SWNT growth with a high preference to large chiral angles. The Fe-Ti-O catalyst was prepared by combining Ti layer deposition onto premade Fe nanoparticles with subsequent high-temperature air calcination, which favours the formation of a homogeneous Fe-Ti-O solid solution. Using CO as the carbon feedstock, chemical vapour deposition growth of SWNTs at 800 o C was demonstrated on the Fe-Ti-O catalyst. Nanobeam electron diffraction characterization on a number of individual SWNTs revealed that more than 94% of SWNTs have chiral angles larger than 15 o . In situ environmental transmission electron microscopy study was carried out to reveal the catalyst dynamics upon reduction. Our results identify that the phase segregation through reducing Fe-Ti-O catalyst leads to the formation of TiO x -supported small Fe nanoparticles for SWNT growth. The strong metal-support interactions induced by partial reduction of TiO x support promote the wettability of Fe nanoparticle, accounting for the preferential growth of large-chiral-angle SWNTs.This work opens a new avenue for chiral angle selective growth of SWNTs.

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Single Nanotube Raman Spectroscopy

Abstract: Inorganic chemistry Inorganic chemistry Z 0100Single Nanotube Raman Spectroscopy -[25 refs.]. -(DRESSELHAUS*, M. S.; DRESSELHAUS, G.; JORIO, A.; SOUZA FILHO, A. G.; PIMENTA, M. A.; SAITO, R.; Acc.

Cited by 194 publications

References 2 publications

Nanoscale Electrocatalysis of Hydrazine Electro-Oxidation at Blistered Graphite Electrodes

Nanoscale Electrocatalysis of Hydrazine Electro-Oxidation at Blistered Graphite Electrodes

Raman microscopy mapping for the purity assessment of chirality enriched carbon nanotube networks in thin-film transistors

Fe Ti O based catalyst for large-chiral-angle single-walled carbon nanotube growth

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