2021
DOI: 10.1109/tdmr.2021.3051846
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Single Event Transient (SET) Mitigation Circuits With Immune Leaf Nodes

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Cited by 6 publications
(1 citation statement)
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“…Transient faults are primarily caused by α-particle striking in integrated circuits and high energy radiations emitted by impurities in the material [19], [20]. The most common effect of transient faults in the NoC is bit flipping.…”
Section: Faults and Their Effect On Interconnection Links In Nocsmentioning
confidence: 99%
“…Transient faults are primarily caused by α-particle striking in integrated circuits and high energy radiations emitted by impurities in the material [19], [20]. The most common effect of transient faults in the NoC is bit flipping.…”
Section: Faults and Their Effect On Interconnection Links In Nocsmentioning
confidence: 99%