Single event transient characterisation of analog IC's for ESA's satellites

Harboe-Sørensen, R.; Guerre, F. X.; Constans, H.; Dooren, J. van; Berger, Guy; Hajdas, W.

doi:10.1109/radecs.1999.858650

Cited by 16 publications

(8 citation statements)

References 6 publications

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“…For VIRGO nearly every transient event also changed the state of the circuits latch, representing power supply switchoff. Slightly lower transient events were measured when using higher delta input levels, as reported in [7]. Typical transient waveforms were rail to rail and up to 2-s duration.…”

Section: Lm/pm139 Quad Voltage Comparator-ad/pmi and Nscmentioning

confidence: 81%

“…GROUND TESTING SOHO flight spare devices were ground tested for SEU at the Heavy Ion Irradiation Facility at the cyclotron at UCL, Louvain-La-Neuve, Belgium (analog ICs and SRAMs), at the Twin Tandem, Brookhaven National Laboratory (BNL), Long Island, NY (DRAMs), and at the Proton Irradiation Facility, PSI, Villigen, Switzerland. To obtain the best possible basis for comparison, various SOHO applications and their associated operating conditions were used during these tests [7].…”

Section: Golf Instrumentmentioning

confidence: 99%

“…Details of the various linear IC tests can be found in [7], however, here, a short summary of relevant information, test conditions, and results will be presented.…”

Section: A Power Supply Eventsmentioning

confidence: 99%

“…A test setup providing simulation of instantaneous pulse current control mode was used [7]. Converted pulse width into transient amplitudes is counted as small errors representing phase shifts and large errors representing period mismatch.…”

Section: Uc1842j Current-mode Pwm Controller-unitrodementioning

confidence: 99%

“…7 10 b/day. The sensitive volume was estimated to be 3.0 3.0 2.0 m and the shielding to be 1 g/cm Al.…”

Section: Predictionsmentioning

confidence: 99%

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Observation and analysis of single event effects on-board the SOHO satellite

Harboe-Sørensen

Daly

Teston

et al. 2002

IEEE Trans. Nucl. Sci.

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SOHO, the European Space Agency (ESA) solar observation satellite, has experienced a large number of single event effects (SEEs) since its launch in December 1995. This paper details events believed to be induced by cosmic rays or protons. Self-switch-off power supply events in the service module and in the payload module will be detailed as well as single event upsets (SEUs) in the solid-state recorder (SSR) and in the global oscillation at low frequency (GOLF) instrument. Power system events are believed to originate from transient SEUs in linear components. SSR and GOLF SEUs are seen to respond to solar particle events. Relevant ground verification testing will be presented and upset predictions are compared with observations. Index Terms-Single-event effect (SEE) ground testing, SEE observations, SEE predictions, single-event transient (SET), singleevent upset (SEU), SOHO satellite.

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Section: Lm/pm139 Quad Voltage Comparator-ad/pmi and Nscmentioning

confidence: 81%

Section: Golf Instrumentmentioning

confidence: 99%

“…Details of the various linear IC tests can be found in [7], however, here, a short summary of relevant information, test conditions, and results will be presented.…”

Section: A Power Supply Eventsmentioning

confidence: 99%

Section: Uc1842j Current-mode Pwm Controller-unitrodementioning

confidence: 99%

“…7 10 b/day. The sensitive volume was estimated to be 3.0 3.0 2.0 m and the shielding to be 1 g/cm Al.…”

Section: Predictionsmentioning

confidence: 99%

See 3 more Smart Citations

Observation and analysis of single event effects on-board the SOHO satellite

Harboe-Sørensen

Daly

Teston

et al. 2002

IEEE Trans. Nucl. Sci.

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A novel high‐precision single‐event transient hardened voltage comparator design

Xie

Liu

et al. 2023

Circuit Theory & Apps

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SummaryTo reduce the impact of the single‐event transient (SET) effect on the high‐precision comparator, based on the common high‐gain pre‐amplification stage structure of the comparator, a new radiation hardened by design (RHBD) method, namely, the sensitive node transient detection feedback latch (SNTDFL) technique, is proposed. The hardening technique avoids comparator erroneous output by detecting the sensitive nodes of the high‐gain pre‐amplification stage. The detection circuit receives the response generated by the high energy particle impacts and feeds the high level back to the sensitive nodes to latch the current comparator state. In this paper, a novel high‐precision SET hardened voltage comparator based on this technique is developed. Through detailed circuit principle and simulation analysis, the functional characteristics and the hardening performance of the high‐precision hardened comparator are verified. Compared with the unhardened and the TMR technique hardened comparator, the SNTDFL technique hardened comparator effectively avoids the erroneous output caused by the SET effect with less overhead and still has excellent functional characteristics.

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