1996
DOI: 10.1109/23.490906
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Single-event phenomena in GaAs devices and circuits

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Cited by 40 publications
(18 citation statements)
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“…The proton flux was set to about 1x10 6 protons/cm 2 -s. This flux was high enough to see frequent voltage pulses, but low enough to obtain accurate waveform counts with the oscilloscope and prevent permanent damage to the detector. To characterize the statistical nature of the voltage pulses, we adjusted the trigger level, counted the number of triggered pulses, and obtained statistics for the amplitude of the pulses.…”
Section: Proton Irradiationmentioning
confidence: 99%
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“…The proton flux was set to about 1x10 6 protons/cm 2 -s. This flux was high enough to see frequent voltage pulses, but low enough to obtain accurate waveform counts with the oscilloscope and prevent permanent damage to the detector. To characterize the statistical nature of the voltage pulses, we adjusted the trigger level, counted the number of triggered pulses, and obtained statistics for the amplitude of the pulses.…”
Section: Proton Irradiationmentioning
confidence: 99%
“…The table gives the number of waveforms, or triggered voltage pulses, in a given period of time and flux. Using these values, we calculated a normalized count that gives the number of counts per second adjusted to a flux of 1.0x10 6 protons/cm 2 -s. Note that the normalized count increases with decreasing trigger level. It is reasonable to assume that trigger levels below 8 mV would have led to even higher counts.…”
Section: Proton Irradiationmentioning
confidence: 99%
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“…As such, single-event research in GaAs devices dates back to the early 1980s [30]. In the early charge collection work on GaAs, simple device structures were used, that were not necessarily any different from their silicon counterparts, as they included only p-n junction and Schottky-barrier diodes [31] (as opposed to later work, which investigated more complex heterostructure-based devices).…”
Section: Gallium Arsenidementioning
confidence: 99%