Abstract:Single-Event Latchup (SEL) is considered as a major reliability issue for the CMOS technology due to its capability of permanently damaging electronic components. In this work, the impact of temperature variation on the SEL mechanism is investigated. As the SEL sensitivity is influenced by design and environment parameters, the temperature variation is also evaluated along the variation of three parameters related to the geometry and to the design of the component: the doping profile, the anode to cathode spac… Show more
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.