Single-Event Characterization of Xilinx UltraScale+^® MPSOC under Standard and Ultra-High Energy Heavy-Ion Irradiation

Abstract

Heavy-Ion irradiation of a Xilinx Ultrascale+ MP-SOC was performed to measure Single-Event-Latch-up and Single-Event-Upset Cross-Sections. Additionally, irradiation with a ultra high energy xenon beam shows similar upset sensitivity.

Radiation effects and radiation hardening technology of new microsystems

“…2017年, 第一次针对基于16 nm FinFET工艺的Xilinx SoC开展了高能中子、热中子和64 MeV质子的单 粒子效应实验研究 [42] ; David等人 [43] 测试了质子单粒 子效应截面, 并预估了空间单粒子翻转率; David等 人 [44] 开展了重离子和中子单粒子闩锁和翻转实验研 究; Maximilien等人 [45] 观察到超高能量重离子导致的 单粒子翻转; Pierre等人 [46] 提出了一种测试方法应用 Xilinx System Validation Tool (SVT)设计表征SoC单 粒子效应; Pierre等人 [47] 应用64 MeV质子辐照研究了 SEM IP核的SEU响应; Philip等人 [48] 测试了质子单粒 子闩锁和翻转的敏感性; Jordan等人 [49] 给出了复杂可 编程多核SoC的中子测试方法和单粒子效应辐照实验 结果. Ballan等人 [50] 针对多核SoC的单粒子效应, 应用 辐照测试评估了ISO 26262和IEC 61508的优点.…”

Evaluating the computational performance of the Xilinx Ultrascale+ EG Heterogeneous MPSoC

“…For example, in the near future, it is expected that the Zynq Ultrascale SOC FPGA will qualify as rad-tolerant and provide more FPGA resources than any other space-grade device (e.g., 10x more logic and 7x more memory compared to the Xilinx Virtex-5QV), as stated in [11]. Regarding the device under study in this work, some studies have been recently carried out to characterize its response to high energy irradiation [24,25].…”

CHARM High-Energy Ions for Microelectronics Reliability Assurance (CHIMERA)

“…In the NA, several experiments were performed to learn from the heavy-ion beams [10]- [12]. Despite the flexibility of NA in terms of ion flux tuning, the energies are too large to provide LETs meaningful for Radiation Hardness Assurance (RHA), even for the heaviest ions in the periodic table.…”