Zurn 200. Jahrestag der Annalen der PhysQA b s t r a c t . Total backward electron yields from 27 elemental, non-crystalline, clean solids were measured during bombardment by H+-, H$-, H$-, He+-and Ax+-ions in the energy range from 100 keV to 800 keV. The yields were found to exhibit an oscillatory dspendence on the atomic number of the target material correlated with the periods of the periodic system. These 2,-oscillations are relatively insensitive to the type of projectile and the impact energy a t the high projectile energies of this experiment. Present theories of electron emission cannot explain the main experimental results. The reasons for this failure are discussed.Ioneninduzierte Elektronenemission von sauberen Metalloberfliichen I n h a l tsiibersicht. Es wurde der Elektronenkoeffizient von 27 elementaren, nichtkristallinen, sauberen Festkorperobcrflachen beim BeschuB durch H+-, H$-, H$-, He+-und Ar+-Ionen im Energiebereich von 100 keV bis 800 keV gemessen. Die Koeffizienten zeigen ein mit den Perioden des Periodensystems oszillatorisches Verhalten in Abhangigkeit von der Ordnungszahl des Targetmaterials. Diese 2,-Oszillationen sind bei den benntzten hohen Projektilenergien nur schwvach abhangig von der Art des Projektils und der EinschuBenergie. Die experimentellen Ergebnisse konnen von gangigen Theorien nicht wiedergegeben werden. Die Griinde werden diskutiert.[a, 6, 18,191 evidence for a nonmonotonic behaviour emerged. Recently we have presented data for thc impact of HT -, €1: -and Ht-ions 011 a variety of different elemental materials at an impact energy of 100 keV/proton which gave evidence of an oscillatory dependence of y with 2, [20]. It is the aim of this contribution to present details of the experimental met hod and further results of a systematic study for impact energies rang-556 Ann. Physik Leipzig 47 (1990) 7ing from 100 keV to 800 keV and for different projectile species. The results allow to test the validity of current theories, the data are of relevance for the contrast of pictures obtained in modern scanning ion microscopes [ 21-231.
ApparatusThe projectiles (singly charged H+-, H$-, H$-, He+-and Ar+-ions) were delivered by a 1.3 MeV Van de Graaff generator. After passing the analysing magnet the ions were focussed onto the entrance slits of the UHV-chamber. A cold trap and a combination of turbomolecular pump, cryo-pump and sublimation pump were mounted in the beamline-system between the accelerator and the first stage of the UHV-system. Here the ion beam passed a set of apertures before entering the actual target chamber (Fig. 1). The base pressure in the target chamber was -1-2x D. HASSELKAMP et al., Electron Emission by Fast Ions 667 27 different elemental solids were investigated: Be. The targets were massive samples of 1 mm thickness and 0 = 10 mm. 14 targets were mounted on a target holder at a time and were positioned by a manipulator in front of the sputter gun, the CMA or in the ion beam position, respectively. Before the experiment started the targets were sputter-clean...